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For the Inventor, By the Inventor

Rehovot, Israel

Nova Corporation


USPTO Granted Patents = 56

% Expired Patents = 1.8

Trademarks = 6

Forward Citations = 25

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79 inventors (with patents filed for the assignee):

goldMedal Gilad Barak (28 out of 53 patents)

silverMedal Yonatan Oren (19 out of 22 patents)

bronzeMedal Elad Schleifer (8 out of 8 patents)

4.  Amir Shayari (8 out of 8 patents)

5.  Yanir Hainick (8 out of 21 patents)

6.  Eyal Hollander (7 out of 7 patents)

7.  Shay Yogev (7 out of 8 patents)

8.  Barak Bringoltz (7 out of 28 patents)

9.  Dror Shafir (6 out of 18 patents)

10.  Oded Cohen (5 out of 11 patents)

11.  Noam Tal (5 out of 6 patents)

12.  Igor Turovets (5 out of 14 patents)

13.  Matthew J Sendelbach (5 out of 27 patents)

14.  Ran Yacoby (5 out of 5 patents)

15.  Daniel Kandel (4 out of 8 patents)


Core Competencies:
Optical Metrology
Raman Spectroscopy
Machine Learning
Spectra-Based Metrology
Semiconductor Manufacturing
Material Characterization
Patterned Structures
Non-Destructive Metrology
Deep Learning
Optical Phase Measurement
X-Ray Measurements
Process Control

56 patents:

1. 12742724 - Method and system for optical characterization of patterned samples (2026-09-22),
2. 12680964 - Time-domain optical metrology and inspection of semiconductor devices (2026-07-14),
3. 12547082 - Combining physical modeling and machine learning (2026-02-10),
4. 12498332 - Imaging metrology (2025-12-16),
5. 12467879 - Optical phase measurement method and system (2025-11-11),
6. 12467869 - Raman spectroscopy based measurement system (2025-11-11),
7. 12392733 - Combined ocd and photoreflectance method and system (2025-08-19),
8. 12372473 - Accurate Raman spectroscopy (2025-07-29),
9. 12366533 - Hybrid metrology method and system (2025-07-22),
10. 12360462 - Optical metrology system and method (2025-07-15),
11. 12359968 - Systems and methods for optical metrology (2025-07-15),
12. 12321102 - Machine and deep learning methods for spectra-based metrology and process control (2025-06-03),
13. 12298182 - Optical technique for material characterization (2025-05-13),
14. 12236364 - Metrology and process control for semiconductor manufacturing (2025-02-25),
15. 12196691 - X-ray based measurements in patterned structure (2025-01-14),
Nova Corporation is a leading technology solutions provider offering a wide range of services including software development, IT consulting, and cybersecurity solutions. With a focus on innovation and customer satisfaction, Nova Corporation has established a strong reputation in the industry. Visit their website for more information and to explore their comprehensive portfolio.
This text is generated by artificial intelligence and may not be accurate.

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USPTO Data Jan 1 1976 - Sep 22 2026

Nova Corporation
56 Patents

#9 in Rehovot

#99 in Israel

#12,719 in the World

Rehovot, IL
Rehovot, Israel

Nova Corporation

Forward Citations = 25

79 inventors:

goldMedal Gilad Barak (28 out of 53 patents)

silverMedal Yonatan Oren (19 out of 22 patents)

bronzeMedal Elad Schleifer (8 out of 8 patents)

4.  Amir Shayari (8 out of 8 patents)

5.  Yanir Hainick (8 out of 21 patents)

Please report any incorrect information to [email protected]
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