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Nova Corporation

USPTO Granted Patents = 52

Trademarks = 8

Forward Citations = 22

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73 inventors (with patents filed for the assignee):

Gilad Barak (25 out of 51 patents)

Yonatan Oren (18 out of 22 patents)

Elad Schleifer (8 out of 8 patents)

4. Amir Shayari (8 out of 8 patents)

5. Eyal Hollander (7 out of 7 patents)

6. Shay Yogev (7 out of 8 patents)

7. Yanir Hainick (7 out of 21 patents)

8. Barak Bringoltz (6 out of 27 patents)

9. Oded Cohen (5 out of 11 patents)

10. Noam Tal (5 out of 6 patents)

11. Dror Shafir (5 out of 17 patents)

12. Igor Turovets (5 out of 14 patents)

13. Daniel Kandel (4 out of 7 patents)

14. Vladimir Machavariani (4 out of 15 patents)

15. Matthew J Sendelbach (4 out of 26 patents)

Core Competencies:

Optical Metrology

Raman Spectroscopy

Machine Learning

Spectra-Based Metrology

Semiconductor Manufacturing

Material Characterization

Patterned Structures

Non-Destructive Metrology

Deep Learning

Optical Phase Measurement

X-Ray Measurements

Process Control

52 patents: Sort by Forward Citations

1. 12498332 - Imaging metrology (2025-12-16),

2. 12467879 - Optical phase measurement method and system (2025-11-11),

3. 12467869 - Raman spectroscopy based measurement system (2025-11-11),

4. 12392733 - Combined ocd and photoreflectance method and system (2025-08-19),

5. 12372473 - Accurate Raman spectroscopy (2025-07-29),

6. 12360462 - Optical metrology system and method (2025-07-15),

7. 12359968 - Systems and methods for optical metrology (2025-07-15),

8. 12321102 - Machine and deep learning methods for spectra-based metrology and process control (2025-06-03),

9. 12298182 - Optical technique for material characterization (2025-05-13),

10. 12236364 - Metrology and process control for semiconductor manufacturing (2025-02-25),

11. 12196691 - X-ray based measurements in patterned structure (2025-01-14),

12. 12165023 - Measuring local CD uniformity using scatterometry and machine learning (2024-12-10),

13. 12163892 - Accurate Raman spectroscopy (2024-12-10),

14. 12152993 - Accurate Raman spectroscopy (2024-11-26),

15. 12152869 - Monitoring system and method for verifying measurements in patterned structures (2024-11-26),

Nova Corporation is a leading technology solutions provider offering a wide range of services including software development, IT consulting, and cybersecurity solutions. With a focus on innovation and customer satisfaction, Nova Corporation has established a strong reputation in the industry. Visit their website for more information and to explore their comprehensive portfolio.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Dec 30 2025

52 Patents

#156 in Osaka

#1,636 in Japan

#13,161 in the World

Nova Corporation

Forward Citations = 22

73 inventors:

Gilad Barak (25 out of 51 patents)

Yonatan Oren (18 out of 22 patents)

Elad Schleifer (8 out of 8 patents)

4. Amir Shayari (8 out of 8 patents)

5. Eyal Hollander (7 out of 7 patents)

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