Location History:
- Rehovot, IL (2022)
- Ramat Hasharon, IL (2023 - 2024)
Company Filing History:
Years Active: 2022-2025
Title: Eyal Hollander: Innovator in Raman Spectroscopy and Optical Metrology
Introduction
Eyal Hollander is a prominent inventor based in Rehovot, Israel. He has made significant contributions to the fields of Raman spectroscopy and optical metrology. With a total of seven patents to his name, Hollander's work has advanced the capabilities of scientific measurement and analysis.
Latest Patents
Hollander's latest patents include a method, system, and non-transitory computer-readable medium for Accurate Raman Spectroscopy. This innovative method involves determining first acquisition parameters of a Raman spectroscope to establish a first acquisition setup. The determination is based on at least one expected radiation pattern detected by a sensor of the Raman spectroscope, resulting from the illumination of a first area of a sample that contains a nano-scale structure. The acquisition parameters are crucial for acquiring at least one first Raman spectrum of the sample. Another notable patent is for Systems and Methods for Optical Metrology. This patent describes systems and methods for metrology of workpieces, such as wafers, using spectrometry of multi-spot arrays. The optical metrology system is designed to measure characteristics of the tested workpiece without affecting it during testing.
Career Highlights
Eyal Hollander is currently employed at Nova Corporation, where he continues to innovate and develop new technologies. His work has been instrumental in enhancing the precision and efficiency of optical measurements in various applications.
Collaborations
Hollander collaborates with talented individuals such as Elad Schleifer and Yonatan Oren. Their combined expertise contributes to the advancement of their projects and the overall success of their innovations.
Conclusion
Eyal Hollander's contributions to Raman spectroscopy and optical metrology exemplify his commitment to innovation in scientific measurement. His patents reflect a deep understanding of complex systems and a drive to improve technological capabilities.