Moshav Givat Yarim, Israel

Igor Turovets

USPTO Granted Patents = 14 

Average Co-Inventor Count = 2.0

ph-index = 3

Forward Citations = 20(Granted Patents)


Location History:

  • Moshav Givat Yarim, IL (2016 - 2021)
  • Moshav Giv'at Ye'arim, IL (2021 - 2023)

Company Filing History:


Years Active: 2016-2025

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14 patents (USPTO):Explore Patents

Title: Innovations and Contributions of Igor Turovets

Introduction

Igor Turovets is a prominent inventor based in Moshav Givat Yarim, Israel. He has made significant contributions to the field of measurement and analysis in patterned structures, holding a total of 13 patents. His work combines advanced methodologies with machine learning to enhance measurement accuracy and efficiency.

Latest Patents

Among his latest patents is a groundbreaking method for measuring local critical dimension (CD) uniformity using scatterometry and machine learning. This innovative approach involves obtaining an optical spectrometry spectrum of an array of two-dimensional structural elements. The acquired spectrum is then processed through a trained machine learning model, which maps the spectrum to determine both the average critical dimension and local critical dimension uniformity. Another notable patent focuses on a monitoring system and method for verifying measurements in patterned structures. This system utilizes a predetermined fitting model to analyze measurement data, classifying results as acceptable or unacceptable and allowing for adjustments based on the analysis.

Career Highlights

Igor Turovets has worked with notable companies in the industry, including Nova Measuring Instruments Ltd. and Nova Corporation. His experience in these organizations has allowed him to apply his innovative ideas and contribute to advancements in measurement technologies.

Collaborations

Throughout his career, Turovets has collaborated with esteemed colleagues such as Oded Cohen and Gilad Barak. These partnerships have fostered

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