Gedera, Israel

Oded Cohen

USPTO Granted Patents = 11 

Average Co-Inventor Count = 4.4

ph-index = 4

Forward Citations = 42(Granted Patents)


Location History:

  • Gedera, IL (2007 - 2023)
  • Rehovot, IL (2021 - 2023)

Company Filing History:


Years Active: 2007-2025

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11 patents (USPTO):

Title: **Innovator Spotlight: Oded Cohen**

Introduction

Oded Cohen, a prominent inventor residing in Gedera, Israel, has made significant contributions to the field of semiconductor manufacturing through his innovative patents. With a total of 10 patents to his name, his work focuses on metrology and process control, leveraging advanced technologies to enhance manufacturing processes.

Latest Patents

One of Cohen's latest patents is centered around a semiconductor metrology system designed for effective process control in semiconductor manufacturing. This invention includes a spectrum acquisition tool that collects baseline scatterometric spectra from semiconductor wafer targets, utilizing a first measurement protocol. It addresses various sources of spectral variability, employing machine learning to predict values for production semiconductor wafer targets based on their spectra.

Additionally, he has developed a system and methods for Advanced Process Control (APC) in semiconductor manufacturing. This system generates machine learning models by correlating pre-process and post-process scatterometric training data, enabling recommendations for adjustments in process control settings to maintain precision despite data variations.

Career Highlights

Throughout his career, Oded Cohen has demonstrated his expertise in semiconductor technology while working for renowned companies such as Nova Corporation and Nova Measuring Instruments Ltd. His work has been invaluable in pushing the boundaries of metrology in the semiconductor industry.

Collaborations

Cohen's success is also attributed to his collaborations with talented professionals in the field, including his coworkers Gilad Barak and Noam Tal. Their combined efforts have helped foster an environment of innovation, leading to the development of cutting-edge solutions in semiconductor manufacturing.

Conclusion

Oded Cohen's contributions to semiconductor metrology are a testament to his ingenuity and dedication to advancing technology. With a robust portfolio of patents, his work continues to influence the industry, paving the way for further advancements in semiconductor manufacturing processes. His journey exemplifies the impact an inventor can have on the world through innovative thinking and collaboration.

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