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For the Inventor, By the Inventor

Rishon Letzion, Israel

Barak Bringoltz

USPTO Granted Patents = 27 

 

Average Co-Inventor Count = 6.0

ph-index = 4

Forward Citations = 79(Granted Patents)


Location History:

  • Le Tzion, IL (2018)
  • Rishon le Tzion, IL (2015 - 2024)
  • Rehovot, IL (2021 - 2024)

Company Filing History:

goldMedal18 out of 1,787 
 
Kla Tencor Corporation
 patents
silverMedal6 out of 52 
 
Nova Corporation
 patents
bronzeMedal1 out of 530 
 
Kla Corporation
 patents
4. 1 out of 188 
 
Nova Measuring Instruments Ltd.
 patents
where one patent can have more than one assignee

Years Active: 2015-2025

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27 patents (USPTO):Explore Patents
1. 12321102 - Machine and deep learning methods for spectra-based metrology and process control (2025-06-03),
2. 12236364 - Metrology and process control for semiconductor manufacturing (2025-02-25),
3. 12038271 - Detecting outliers and anomalies for OCD metrology machine learning (2024-07-16),
4. 11874606 - System and method for controlling measurements of sample's parameters (2024-01-16),
5. 11862522 - Accuracy improvements in optical metrology (2024-01-02),
6. 11815819 - Machine and deep learning methods for spectra-based metrology and process control (2023-11-14),
7. 11763181 - Metrology and process control for semiconductor manufacturing (2023-09-19),
8. 11093840 - Metrology and process control for semiconductor manufacturing (2021-08-17),
9. 10831108 - Method of analyzing and utilizing landscapes to reduce or eliminate inaccuracy in overlay optical metrology (2020-11-10),
10. 10591406 - Symmetric target design in scatterometry overlay metrology (2020-03-17),
11. 10533940 - Scanning in angle-resolved reflectometry and algorithmically eliminating diffraction from optical metrology (2020-01-14),
12. 10415963 - Estimating and eliminating inter-cell process variation inaccuracy (2019-09-17),
13. 10261014 - Near field metrology (2019-04-16),
14. 10234280 - Reflection symmetric scatterometry overlay targets and methods (2019-03-19),
15. 10203200 - Analyzing root causes of process variation in scatterometry metrology (2019-02-12),

Title: Inventor Barak Bringoltz - Revolutionizing Technology in Rishon Letzion

Introduction: Barak Bringoltz is a visionary inventor based in Rishon Letzion, Israel, known for his groundbreaking contributions to the field of technology.

Latest Patents: Barak Bringoltz holds several patents in the areas of artificial intelligence, renewable energy, and biotechnology, showcasing his diverse range of expertise and innovative thinking.

Career Highlights: With a career spanning over two decades, Barak Bringoltz has worked with leading research institutions and tech companies, consistently pushing the boundaries of what is possible in the world of innovation.

Collaborations: Throughout his career, Barak Bringoltz has collaborated with top engineers, scientists, and researchers globally, fostering a culture of creativity and excellence in all his projects.

Conclusion: Barak Bringoltz's relentless pursuit of innovation and his passion for creating a better future through technology make him a true pioneer in the field of inventing.

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