Matthew J Sendelbach

Title: Matthew J. Sendelbach: Innovator in Optical Characterization and Metrology

Introduction: Matthew J. Sendelbach, based in Wappingers Falls, NY, is a prolific inventor with an impressive portfolio of 26 patents. His innovative contributions have significantly advanced the fields of optical characterization and metrology, paving the way for increased precision in the analysis of patterned samples.

Latest Patents: Among Matthew's latest patents are groundbreaking methods and systems for optical characterization of patterned samples and a TEM-based metrology method. The first patent focuses on measuring asymmetry in patterned regions by directing illuminating light and collecting reflected light with varying polarization states. Through this process, Matthew's invention generates measured data pieces, enabling detailed analysis and assessment of asymmetrical conditions in samples.

The TEM-based metrology method revolves around analyzing three-dimensional patterned structures. This method involves a fitting procedure that compares measured transmission electron microscopy (TEM) image data with simulated data, facilitating the determination of critical structure parameters. Such innovations exemplify Matthew's dedication to enhancing measurement techniques in complex materials.

Career Highlights: Matthew's professional journey includes notable tenures at esteemed organizations such as IBM and Nova Measuring Instruments Ltd. At these companies, he honed his expertise and developed products that have dramatically improved metrology and optical characterization processes.

Collaborations: Throughout his career, Matthew has collaborated with distinguished colleagues, including Charles Neill Archie and Alok Vaid. These partnerships have contributed to the refinement and success of his innovative projects, fostering an environment of shared knowledge and expertise.

Conclusion: Matthew J. Sendelbach stands out as a leading inventor in the realms of optical characterization and metrology. His 26 patents reflect a commitment to innovation and excellence, making significant contributions that benefit various industries. As technology continues to evolve, Matthew’s work remains pivotal in shaping future advancements in measurement and analysis techniques.