Bruce H Newcome

Title: The Innovator Behind Semiconductor Metrology - Bruce H. Newcome

Introduction

Bruce H. Newcome, an accomplished inventor based in Sunnyvale, CA, has made significant contributions to the fields of semiconductor metrology and surface analysis. With a total of 10 patents to his name, Newcome has dedicated his career to enhancing the precision and accuracy required in semiconductor manufacturing processes.

Latest Patents

Newcome's latest innovations include sophisticated systems and approaches for semiconductor metrology that utilize Secondary Ion Mass Spectrometry (SIMS). One of his remarkable patents describes a SIMS system comprising a sample stage where a primary ion beam is directed. This innovative setup features an extraction lens designed to provide a low extraction field for secondary ions emitted from the sample. Alongside this, his work includes a magnetic sector spectrograph that works in conjunction with an electrostatic analyzer and a magnetic sector analyzer.

Additionally, he has developed patterned X-ray emitting targets that improve X-ray sources used in various systems, including X-ray reflectance scatterometry (XRS), X-ray photoelectron spectroscopy (XPS), and X-ray fluorescence (XRF) systems. These advancements contribute to more effective and efficient analytical techniques in semiconductor research and development.

Career Highlights

Throughout his career, Bruce H. Newcome has worked with notable companies such as Nova Measuring Instruments Ltd. and Revera, Incorporated. His experience in these organizations has played a crucial role in shaping his innovative approaches to semiconductor technology.

Collaborations

In his journey of exploration and invention, Newcome has collaborated with several talented professionals, including colleagues David Allen Reed and Bruno W. Schueler. These partnerships have fostered a collaborative environment that encourages the continuous development of cutting-edge technologies.

Conclusion

With a strong portfolio of 10 patents and a commitment to advancing semiconductor measurement techniques, Bruce H. Newcome stands as a pivotal figure in the innovation landscape. His work not only enhances manufacturing processes but also paves the way for future advancements in the semiconductor industry. As technology continues to evolve, Newcome's contributions remain invaluable to researchers and practitioners alike.