David Allen Reed

Title: Innovations and Contributions of David Allen Reed

Introduction

David Allen Reed, based in Belmont, California, is a distinguished inventor with a remarkable portfolio of 24 patents. His work primarily focuses on advanced measurement systems, including technologies that utilize X-ray and mass spectrometry. Reed's innovations have made significant contributions to the fields of material science and analytical chemistry.

Latest Patents

Among his latest patents, the "System and method for measuring a sample by x-ray reflectance scatterometry" stands out. This invention involves impinging an incident X-ray beam on a periodic structure, generating a scattered X-ray beam while simultaneously providing multiple incident and azimuthal angles. The technology is designed to collect at least a portion of the scattered X-ray beam, enhancing measurement accuracy.

Another significant invention is the "Mass spectrometer detector and system and method using the same." This patent describes an ion detector for secondary ion mass spectrometry. It comprises an electron emission plate emitting electrons upon ion incidence, a scintillator that releases photons, and a lightguide that confines photon flow to a solid-state photomultiplier. This setup offers improved efficiency in ion detection and analysis within mass spectrometry systems.

Career Highlights

David Reed has held notable positions at esteemed organizations such as Nova Measuring Instruments Ltd. and Revera Incorporated. His experience in these companies has been instrumental in the development of advanced measurement technologies, reflecting his expertise and innovation in the field.

Collaborations

Reed has worked alongside talented professionals, including Bruno W. Schueler and Rodney C. Smedt. These collaborations have facilitated significant advancements in the technologies he has developed, showcasing the importance of teamwork in driving innovation.

Conclusion

David Allen Reed's contributions through his patents and collaborations reaffirm his status as a leading inventor in his field. His innovative approaches to measurement technologies continue to influence research and development, solidifying his legacy in the scientific community. As he continues to innovate, the impact of his work will undoubtedly resonate in various applications, furthering advancements in material science and analytical methods.