John F Moulder

Title: John F. Moulder: Innovator in Thin Film Characterization

Introduction

John F. Moulder, based in Bloomington, Minnesota, is a notable inventor known for his contributions to thin film characterization. With two patents to his name, Moulder's work has significantly advanced the methodologies used in electron spectroscopy and material analysis.

Latest Patents

Moulder's latest patents focus on innovative systems and methods for depth profiling and characterization of thin films. His first patent outlines a technique for characterizing a sample, particularly focusing on establishing a depth profile through the use of low ion energy ions and an optimized ion beam angle. The method employs an analyzer positioned at a high angle to capture photoelectrons emitted from the sample under x-ray exposure. This process is enhanced by a correction algorithm that determines the concentration of elements or chemical species at various depths within the thin film.

The second patent, which aims for nondestructive characterization of thin films, details a comparative approach that uses measured basis spectra to assess film thickness, specifically for silicon oxynitride films. Through the non-linear least squares fitting algorithm, Moulder’s technique compares measured peak shapes of elemental and chemical species to those collected, ensuring precise material characterization.

Career Highlights

Moulder is currently associated with Revera, Incorporated, a company that focuses on innovative solutions in materials science. His expertise in thin film characterization and electron spectroscopy has established him as a key figure in the field, contributing valuable insights and techniques that are now utilized in various applications.

Collaborations

Throughout his career, John F. Moulder has collaborated with esteemed colleagues, including Paul E. Larson and David G. Watson. This collaboration has fostered a rich environment for innovation, enabling the development of cutting-edge technologies in material characterization.

Conclusion

As a dedicated inventor, John F. Moulder's work in the field of thin film characterization has made a lasting impact on material science. His patents reflect a clear commitment to advancing the understanding and utilization of thin films, paving the way for further innovations in the industry.