Sunnyvale, CA, United States of America

Michael C Kwan

USPTO Granted Patents = 19 

 

Average Co-Inventor Count = 4.6

ph-index = 7

Forward Citations = 643(Granted Patents)


Location History:

  • Redwood City, CA (US) (2002 - 2006)
  • Sunnyvale, CA (US) (2007 - 2023)

Company Filing History:


Years Active: 2002-2023

Loading Chart...
Loading Chart...
19 patents (USPTO):

Title: Innovations of Michael C. Kwan in Thin Film Characterization

Introduction

Michael C. Kwan is a notable inventor based in Sunnyvale, CA, renowned for his contributions to the field of thin film characterization. With a remarkable portfolio of 19 patents, Kwan has significantly advanced techniques involving X-ray photoelectron spectroscopy (XPS) and X-ray fluorescence (XRF) technologies. His inventions have paved the way for improved methods in material science and engineering.

Latest Patents

Among his latest patents, Kwan focuses on the "Feed-forward of multi-layer and multi-process information using XPS and XRF technologies." This innovative method enhances thin film characterization through precise measurements of XPS and XRF intensity signals. The process includes assessing a sample with multiple layers, determining the thickness of each layer, and estimating the characteristics of the substrate. By effectively combining information from different layers, Kwan’s technologies provide a comprehensive understanding of material properties crucial for various applications.

Career Highlights

Michael Kwan has built his career at esteemed companies such as Applied Materials, Inc. and Revera Incorporated. His work at these organizations has been instrumental in refining and implementing advanced methodologies for material analysis, showcasing his commitment to innovation in the semiconductor and materials industries.

Collaborations

Throughout his career, Kwan has collaborated with several prominent professionals, including Bruno W. Schueler and David Allen Reed. These partnerships have led to significant advancements in technology, reflecting Kwan’s ability to work effectively within teams to drive innovation forward.

Conclusion

Michael C. Kwan's contributions to thin film characterization through his patents and collaborative efforts exemplify the impact that dedicated inventors can have on technology and industry. As his work continues to influence various sectors, Kwan remains a vital figure in the evolution of material science methodologies.

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…