Portland, OR, United States of America

Walid M Hafez

This inventor holds 173 USPTO granted patents and 40 published patent applications and 21 EPO patents, primarily in Nanofabrication Technology (CPC class H01L29-66545). Top assignees: Intel Corporation, Tahoe Research, Ltd., Other. Active years: 2011-2026.

USPTO Granted Patents = 173 

% Patents Active = 86.1

 

Average Co-Inventor Count = 4.4

ph-index = 7

Forward Citations = 408(Granted Patents)

Forward Citations (Not Self Cited) = 360(Dec 10, 2025)


Inventors with similar research interests:

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Company Filing History:


Years Active: 2011-2026

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Areas of Expertise:
Nanoribbon Transistors
FinFET Devices
High-Voltage Transistors
Gate-All-Around Structures
Charge Trap Flash Memory
Dielectric Tuning
3D Nanowire Inverters
Epitaxial Integration
Dual Threshold Voltage
Silicide Fabrication
Non-Planar I/O Devices
Interconnect Structures
173 patents (USPTO):Explore Patents

Title: Walid Hafez: Innovating Transistor Gate Structures and III-N MISFETs

Introduction:

Walid Hafez, a talented inventor based in Portland, Oregon, has made significant contributions to the field of semiconductor technology. With a remarkable 132 patents to his name, Hafez has consistently pushed the boundaries of transistor gate structures and III-N metal-insulator-semiconductor field-effect transistors (MISFETs). Through his innovative work, Hafez has helped pave the way for advancements in semiconductor devices and their applications.

Latest Patents:

One of Hafez's latest patents is for a "Transistor Gate Structure with Hybrid Stacks of Dielectric Material." This invention involves an integrated circuit that incorporates a gate structure featuring gate dielectric and a gate electrode. Notably, the gate dielectric consists of at least two hybrid stacks of dielectric material, with each hybrid stack including a layer of low-κ dielectric and a layer of high-κ dielectric. The hybrid stacks are designed to optimize the performance of group III-V transistors, making them a crucial element in next-generation semiconductor devices.

Another notable recent patent is for "III-N Metal-Insulator-Semiconductor Field Effect Transistors with Multiple Gate Dielectric Materials." This invention is focused on integrating III-N MISFET structures that utilize gate dielectric materials differing across the transistors. By carefully selecting the gate dielectric materials, Hafez's invention enables the modulation of dielectric breakdown strength and threshold voltage between transistors within the integrated circuit. Such control over the gate dielectric materials allows for the creation of different modes of operation and voltage ranges within a single chip, expanding the potential applications of MISFETs.

Career Highlights:

Walid Hafez's impressive patent portfolio demonstrates his extensive experience and expertise in the semiconductor industry. He has made substantial contributions during his tenure working with Intel Corporation, a global leader in semiconductor manufacturing, where he likely played a vital role in their research and development efforts. Additionally, Hafez has collaborated with other industry experts, including Chia-Hong Jan and Joodong Park, who have likely shared their insights and expertise, fostering innovation and driving advancements in their fields.

Collaborations:

Hafez's collaborations have further enriched his contributions to the field. Working alongside renowned experts such as Chia-Hong Jan and Joodong Park, Hafez has benefited from the collective knowledge and experience of these exceptional individuals. The synergy created through collaborations elevates the quality and impact of their collective work, fueling innovation in semiconductor technology.

Conclusion:

Walid Hafez's dedication and inventiveness in the field of semiconductor technology have led to numerous breakthroughs in transistor gate structures and III-N MISFET devices. His impressive patent record showcases his expertise and innovative thinking. As Hafez's contributions continue to shape the semiconductor landscape, we can expect his work to inspire future advancements in this rapidly evolving field.

Profile summary based on public USPTO records.
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