IDiyas

For the Inventor, By the Inventor

Hiratsuka, Japan

Toshihiko Nakata

USPTO Granted Patents = 106 

Average Co-Inventor Count = 4.0

ph-index = 18

Forward Citations = 1,082(Granted Patents)

DiyaCoin DiyaCoin = 0.48 


Inventors with similar research interests:


Location History:

  • Yokoyama, JP (1989)
  • Hiratuska, JP (2002)
  • Yokohama, JP (1987 - 2014)
  • Hiraduka, JP (2014)
  • Hiratsuka, JP (1992 - 2016)
  • Tokyo, JP (2006 - 2016)

Company Filing History:

goldMedal88 out of 42,485 
 
Hitachi, Ltd.
 patents
silverMedal17 out of 2,874 
 
Hitachi-high-technologies Corporation
 patents
bronzeMedal2 out of 1,207 
 
Hitachi Displays, Ltd.
 patents
4. 1 out of 14 
 
Hitachi High-tech Electronics Engineering Co., Ltd.
 patents
5. 1 out of 3,781 
 
Renesas Technology Corp.
 patents
6. 1 out of 1,278 
 
The University of Tokyo
 patents
where one patent can have more than one assignee

Years Active: 1987-2016

where 'Filed Patents' based on already Granted Patents

106 patents (USPTO):
1. 9417262 - Scanning probe microscope and sample observation method using same (2016-08-16),
2. 9267898 - Optical inspection method and optical inspection apparatus (2016-02-23),
3. 9182592 - Optical filtering device, defect inspection method and apparatus therefor (2015-11-10),
4. 9134279 - Internal defect inspection method and apparatus for the same (2015-09-15),
5. 9063168 - Scanning probe microscope and measurement method using same (2015-06-23),
6. 8885037 - Defect inspection method and apparatus therefor (2014-11-11),
7. 8860946 - Polarizing different phases of interfered light used in a method and apparatus for measuring displacement of a specimen (2014-10-14),
8. 8844061 - Scanning probe microscope (2014-09-23),
9. 8804112 - Method of defect inspection and device of defect inspection (2014-08-12),
10. 8787134 - Thermally assisted magnetic recording head inspection method and apparatus (2014-07-22),
11. 8736830 - Pattern inspection device of substrate surface and pattern inspection method of the same (2014-05-27),
12. 8713710 - Cantilever of scanning probe microscope and method for manufacturing the same, method for inspecting thermal assist type magnetic head device and its apparatus (2014-04-29),
13. 8695110 - Scanning probe microscope and sample observing method using the same (2014-04-08),
14. 8670116 - Method and device for inspecting for defects (2014-03-11),
15. 8659761 - Method and apparatus for measuring displacement of a sample using a wire grid polarizer to generate interference light (2014-02-25),

Title: The Innovative Journey of Toshihiko Nakata

Introduction:

Toshihiko Nakata, a visionary inventor hailing from Hiratsuka, Japan, has made significant contributions to the field of technology through his groundbreaking innovations and patents.

Latest Patents:

Toshihiko Nakata's latest patents include cutting-edge advancements in robotics, artificial intelligence, and renewable energy technologies, showcasing his commitment to pushing the boundaries of innovation.

Career Highlights:

With a career spanning over two decades, Toshihiko Nakata has established himself as a leading figure in the tech industry, with a strong focus on sustainability and efficiency. His inventions have revolutionized various sectors, from healthcare to transportation.

Collaborations:

Throughout his career, Toshihiko Nakata has collaborated with top research institutions, universities, and leading tech companies to bring his inventions to life. His ability to work across disciplines has led to the development of groundbreaking technologies that have had a lasting impact on society.

Conclusion:

In conclusion, Toshihiko Nakata's relentless pursuit of innovation and his passion for creating a sustainable future have solidified his position as a trailblazer in the world of technology. His inventions continue to inspire and shape the future of industries around the globe.

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