Mill-Jer Wang

This inventor holds 82 USPTO granted patents and 7 published patent applications, primarily in Semiconductor Testing (CPC class G01R31-318513). Top assignees: Taiwan Semiconductor Manufacturing Comp. Ltd., Taiwan Semiconductor Manufacturing Co., Ltd.. Active years: 2010-2026.

USPTO Granted Patents = 82 (Patent Applications = 7)

% Patents Active = 81.7

Average Co-Inventor Count = 4.2

ph-index = 8

Forward Citations = 215(Granted Patents)

Forward Citations (Not Self Cited) = 155(Dec 10, 2025)

Inventors with similar research interests:

Company Filing History:

80 out of 42,759

Taiwan Semiconductor Manufacturing Comp. Ltd.

patents

2 out of 463

Taiwan Semiconductor Manufacturing Co., Ltd.

patents

Years Active: 2010-2026

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Areas of Expertise:

Semiconductor Structure

Testing Module

High-Frequency Antennas

Probe Head Structure

Electromagnetic Shielding

3D Integrated Circuit

Testing Apparatus

Universal Test Mechanism

High-Density Probing

Alignment Testing

Manufacturing Method

Test Circuit

82 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 12704541 - Testing module and testing method using the same (2026-08-11),

2. 12696741 - Semiconductor device and method (2026-07-28),

3. 12571832 - Inspection apparatus and method (2026-03-10),

4. 12322742 - Semiconductor structure and manufacturing method thereof (2025-06-03),

5. 12105131 - Antenna testing device for high frequency antennas (2024-10-01),

6. 12062586 - Semiconductor device structure with magnetic element (2024-08-13),

7. 12019097 - Method for forming probe head structure (2024-06-25),

8. 11906573 - Testing module and testing method using the same (2024-02-20),

9. 11855066 - Semiconductor structure and manufacturing method thereof (2023-12-26),

10. 11852672 - Test circuit and method (2023-12-26),

11. 11726122 - Antenna testing device and method for high frequency antennas (2023-08-15),

12. 11726112 - Electromagnetic shielding during wafer stage testing (2023-08-15),

13. 11693045 - Testing module and testing method using the same (2023-07-04),

14. 11631621 - Semiconductor device structure with magnetic element (2023-04-18),

15. 11585846 - Testing module and testing method using the same (2023-02-21),

Title: Mill-Jer Wang - Innovative Inventor from Hsinchu

Introduction: Mill-Jer Wang is a renowned inventor hailing from Hsinchu, Taiwan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Wang's latest patents focus on advancements in semiconductor technology, particularly in the development of cutting-edge microchips for various electronic devices.

Career Highlights: With a career spanning over two decades, Wang has worked with leading tech companies and research institutions in Taiwan, playing a pivotal role in the creation of next-generation technologies.

Collaborations: Wang has collaborated with top engineers, scientists, and researchers in the industry, fostering a culture of innovation and pushing the boundaries of what is possible in the tech world.

Conclusion: Mill-Jer Wang's dedication to innovation and his relentless pursuit of technological advancement continue to inspire the next generation of inventors and shape the future of the tech industry.