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For the Inventor, By the Inventor

Taipei, Taiwan

Hao Chen

This inventor holds 57 USPTO granted patents, primarily in Semiconductor Testing (CPC class H01L). Top assignees: Taiwan Semiconductor Manufacturing Comp. Ltd., Chang Chun Petrochemical Co., Ltd., Chang Chun Plastics Co., Ltd.. Active years: 2013-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hao Chen. Retrieved from https://idiyas.com/inventor/hao-chen-5ubpoki4

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 57

% Patents Active = 86.0

Average Co-Inventor Count = 4.4

ph-index = 6

Forward Citations = 145(Granted Patents)

Forward Citations (Not Self Cited) = 97(Dec 10, 2025)


Inventors with similar research interests:


Location History:

  • New Tapei, TW (2016)
  • Luzhou, TW (2013 - 2018)
  • Hsinchu, TW (2015 - 2020)
  • New Taipei, TW (2016 - 2024)

Company Filing History:

goldMedal55 out of 42,872 
 
Taiwan Semiconductor Manufacturing Comp. Ltd.
 patents
silverMedal1 out of 106 
 
Chang Chun Petrochemical Co., Ltd.
 patents
bronzeMedal1 out of 103 
 
Chang Chun Plastics Co., Ltd.
 patents
4. 1 out of 17 
 
Far Eastone Telecommunications Co., Ltd.
 patents
5. 1 out of 1,308 
 
National Tsing Hua University
 patents
where one patent can have more than one assignee

Years Active: 2013-2026

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Areas of Expertise:
Integrated Circuits
Testing Devices
Probe Systems
Alignment Testing
3D IC Testing
Circuit Probing
Carbon Capture
Semiconductor Structures
Wafer Testing
Composite Circuits
Testing Modules
Electrostatic Discharge
57 patents (USPTO):Explore Patents
1. 12704541 - Testing module and testing method using the same (2026-08-11),
2. 12451931 - System and method for automatically adjusting beam direction of reflector (2025-10-21),
3. 12019097 - Method for forming probe head structure (2024-06-25),
4. 11994534 - Testing device for integrated circuit package (2024-05-28),
5. 11906573 - Testing module and testing method using the same (2024-02-20),
6. 11852672 - Test circuit and method (2023-12-26),
7. 11693045 - Testing module and testing method using the same (2023-07-04),
8. 11604211 - Testing device and method for integrated circuit package (2023-03-14),
9. 11585846 - Testing module and testing method using the same (2023-02-21),
10. 11579190 - Testing holders for chip unit and die package (2023-02-14),
11. 11467203 - Test circuit and method (2022-10-11),
12. 11387683 - Composite integrated circuits and methods for wireless interactions therewith (2022-07-12),
13. 11340291 - Testing holders for chip unit and die package (2022-05-24),
14. 11293974 - System and method for semiconductor device testing (2022-04-05),
15. 11231453 - Alignment testing for tiered semiconductor structure (2022-01-25),

Title: The Innovative Journey of Hao Chen

Introduction: Hao Chen, a visionary inventor hailing from New Taipei, Taiwan, has made significant contributions to the world of technology through his groundbreaking inventions and patents.

Latest Patents: Chen's latest patents focus on advancements in renewable energy technologies, particularly in the field of solar power efficiency and energy storage solutions.

Career Highlights: With a career spanning over two decades, Hao Chen has established himself as a leading figure in the tech industry, with a strong focus on sustainability and environmental innovation. His work has been recognized globally for its impact and ingenuity.

Collaborations: Throughout his career, Chen has collaborated with top research institutions and leading tech companies to further develop and implement his inventions. His collaborative efforts have led to the successful commercialization of several groundbreaking technologies.

Conclusion: Hao Chen's dedication to innovation and sustainability has not only shaped the tech industry but has also paved the way for a more sustainable future. His relentless pursuit of technological advancement continues to inspire inventors and entrepreneurs worldwide.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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