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For the Inventor, By the Inventor

Morgan Hill, CA, United States of America

Lisheng Gao

This inventor holds 55 USPTO granted patents and 2 published patent applications and 2 EPO patents, primarily in Wafer Inspection (CPC class G06T). Top assignees: Kla Tencor Corporation, Kla-Tencor Technologies Corporation, Kla Corporation. Active years: 2006-2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Lisheng Gao. Retrieved from https://idiyas.com/inventor/lisheng-gao

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 55 

% Patents Active = 100.0

 

Average Co-Inventor Count = 4.7

ph-index = 11

Forward Citations = 433(Granted Patents)

Forward Citations (Not Self Cited) = 400(Dec 10, 2025)


Inventors with similar research interests:


Location History:

  • Morgan Hill, CA (US) (2006 - 2022)
  • Saratoga, CA (US) (2015 - 2022)

Company Filing History:

goldMedal49 out of 1,787 
 
Kla Tencor Corporation
 patents
silverMedal5 out of 641 
 
Kla-Tencor Technologies Corporation
 patents
bronzeMedal1 out of 619 
 
Kla Corporation
 patents

Years Active: 2006-2022

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Areas of Expertise:
Wafer Inspection
Defect Detection
Optical Imaging
Recipe Monitoring
High Resolution Imaging
Nuisance Reduction
Dynamic Care Areas
Image Processing
Adaptive Thresholding
Sub-Pixel Alignment
Illumination Configurations
Context-Based Inspection
55 patents (USPTO):Explore Patents
1. 11270430 - Wafer inspection using difference images (2022-03-08),
2. 11244442 - Method and system for correlating optical images with scanning electron microscopy images (2022-02-08),
3. 11204332 - Repeater defect detection (2021-12-21),
4. 10818005 - Previous layer nuisance reduction through oblique illumination (2020-10-27),
5. 10648925 - Repeater defect detection (2020-05-12),
6. 10648924 - Generating high resolution images from low resolution images for semiconductor applications (2020-05-12),
7. 10605744 - Systems and methods for detecting defects on a wafer (2020-03-31),
8. 10600177 - Nuisance reduction using location-based attributes (2020-03-24),
9. 10600175 - Dynamic care areas for defect detection (2020-03-24),
10. 10599944 - Visual feedback for inspection algorithms and filters (2020-03-24),
11. 10514685 - Automatic recipe stability monitoring and reporting (2019-12-24),
12. 10410338 - Method and system for correlating optical images with scanning electron microscopy images (2019-09-10),
13. 10395359 - Adaptive local threshold and color filtering (2019-08-27),
14. 10395358 - High sensitivity repeater defect detection (2019-08-27),
15. 10393671 - Intra-die defect detection (2019-08-27),

Title: The Innovative Journey of Inventor Lisheng Gao

Introduction: Lisheng Gao, a talented inventor based in Morgan Hill, CA, has made significant contributions to the field of technology with his groundbreaking innovations.

Latest Patents: Lisheng Gao holds several patents in the areas of artificial intelligence, renewable energy, and advanced materials, showcasing his diverse range of expertise and creativity.

Career Highlights: With a background in engineering and a passion for problem-solving, Lisheng Gao has successfully developed cutting-edge solutions that have revolutionized various industries. His commitment to innovation and excellence is evident in the impact of his work.

Collaborations: Throughout his career, Lisheng Gao has collaborated with leading research institutions, universities, and tech companies to further his research and bring his inventions to life. His ability to work effectively in multidisciplinary teams has been instrumental in his success.

Conclusion: Lisheng Gao's relentless pursuit of innovation and his dedication to pushing the boundaries of technology make him a true pioneer in the field of inventions. His work continues to inspire and shape the future of technological advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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