Xinpu, Taiwan

Chun Hsiung Tsai

This inventor holds 194 USPTO granted patents and 26 published patent applications, primarily in Semiconductor Manufacturing (CPC class H01L29-66795). Top assignee: Taiwan Semiconductor Manufacturing Comp. Ltd.. Active years: 2012-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chun Hsiung Tsai. Retrieved from https://idiyas.com/inventor/chun-hsiung-tsai

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 194 

% Patents Active = 85.1

Average Co-Inventor Count = 2.9

ph-index = 11

Forward Citations = 603(Granted Patents)

Forward Citations (Not Self Cited) = 524(Dec 10, 2025)


Inventors with similar research interests:

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Location History:

  • Xinpu Township, Hsinchu County, TW (2012 - 2019)
  • Xinpu Township, TW (2012 - 2024)
  • Hsinchu County, TW (2015 - 2024)
  • Hsinchu, TW (2016 - 2024)

Company Filing History:


Years Active: 2012-2026

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Areas of Expertise:
Semiconductor Device
FinFET Fabrication
Gate Structure
Doping Techniques
High-K Metal Gates
Isolation Structures
Source/Drain Contacts
Epitaxy Formation
Trap Defect Reduction
LDD-free Structure
Transistor Manufacturing
194 patents (USPTO):Explore Patents

Title: Chun Hsiung Tsai: Innovating the Semiconductor Industry

Introduction:

Meet Chun Hsiung Tsai, a visionary inventor and engineer based in Xinpu Township, Taiwan. With an impressive portfolio of 167 patents, Tsai has made significant contributions to the semiconductor industry. Working as part of Taiwan Semiconductor Manufacturing Company Limited (TSMC), Tsai has played a crucial role in developing cutting-edge technologies that have propelled the industry forward.

Latest Patents:

Among Chun Hsiung Tsai's recent patents are two groundbreaking inventions that have brought him well-deserved recognition. The first, titled "Method for forming source/drain contacts," introduces an innovative semiconductor structure. This structure includes a substrate, a semiconductor fin connected to the substrate, and an epitaxial layer made of silicon germanium, enriched with gallium. The incorporation of gallium in the epitaxial layer enhances performance and ensures reliable source/drain contacts.

His second patent, "Semiconductor device with reduced trap defect and method of forming the same," outlines a novel approach in manufacturing semiconductor devices. The method involves introducing a trap-repairing element on dielectric layers, forming a replacement gate, and employing inter-layer dielectric (ILD) for optimal device performance. Tsai's invention not only streamlines the manufacturing process but also reduces trap defects, resulting in superior semiconductor devices.

Career Highlights:

Chun Hsiung Tsai's remarkable career spans several years, during which he has consistently pushed the boundaries of innovation in the semiconductor field. His expertise in semiconductor materials and device manufacturing has earned him a reputation as a seasoned professional in the industry. Tsai's relentless pursuit of excellence has led to the successful development and commercialization of numerous semiconductor technologies.

Collaborations:

Tsai's contributions have been further enhanced through collaborations with talented peers in the industry. Among his esteemed colleagues are Clement Hsingjen Wann and Kuo-Feng Yu. Their combined expertise and shared dedication have resulted in remarkable breakthroughs. By working together, they have pushed the boundaries of semiconductor technology and paved the way for revolutionary advancements.

Conclusion:

Chun Hsiung Tsai's outstanding achievements and numerous patents showcase his unwavering commitment to innovation in the semiconductor industry. With his groundbreaking inventions and collaborative spirit, Tsai has made a profound impact on device manufacturing, materials science, and overall technology advancement. As he continues to contribute to the field, we eagerly anticipate the next wave of inventions and advancements that will shape the future of the semiconductor industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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