The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2025

Filed:

Feb. 08, 2024
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;

Inventors:

Shahaji B. More, Hsinchu, TW;

Chun Hsiung Tsai, Xinpu Township, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/786 (2005.12); H01L 21/02 (2005.12); H01L 21/8238 (2005.12); H01L 27/092 (2005.12); H01L 29/06 (2005.12); H01L 29/423 (2005.12); H01L 29/66 (2005.12);
U.S. Cl.
CPC ...
H01L 29/78618 (2012.12); H01L 21/02532 (2012.12); H01L 21/02603 (2012.12); H01L 21/823807 (2012.12); H01L 21/823814 (2012.12); H01L 21/823828 (2012.12); H01L 21/823864 (2012.12); H01L 21/823878 (2012.12); H01L 27/092 (2012.12); H01L 29/0653 (2012.12); H01L 29/0673 (2012.12); H01L 29/42392 (2012.12); H01L 29/66545 (2012.12); H01L 29/66553 (2012.12); H01L 29/66742 (2012.12); H01L 29/78696 (2012.12);
Abstract

In a method of manufacturing a semiconductor device, a fin structure is formed. The fin structure includes a stacked layer of first semiconductor layers and second semiconductor layers disposed over a bottom fin structure, and a hard mask layer over the stacked layer. An isolation insulating layer is formed so that the hard mask layer and the stacked layer are exposed from the isolation insulating layer. A sacrificial cladding layer is formed over at least sidewalls of the exposed hard mask layer and stacked layer. A first dielectric layer is formed, and a second dielectric layer made of a different material than the first dielectric layer is formed over the first dielectric layer. The second dielectric layer is recessed, and a third dielectric layer made of a different material than the second dielectric layer is formed on the recessed second dielectric layer, thereby forming a wall fin structure.


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