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USPTO Data Jan 1 1976 - Oct 27 2026
72 Patents
#44 in Singapore
#44 in Singapore
#10,400 in the World
Silanna Uv Technologies Pte Ltd
Forward Citations = 404
16 inventors:
Silanna Uv Technologies Pte Ltd
Calculating rank
EPO Patents = 1
Forward Citations = 404
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16 inventors (with patents filed for the assignee):
Petar Branko Atanackovic (65 out of 81 patents)
Johnny Cai Tang (8 out of 9 patents)
Norbert Krause (8 out of 9 patents)
4. Guilherme Tosi (7 out of 7 patents)
5. Matthew Godfrey (5 out of 7 patents)
6. Liam Anderson (4 out of 4 patents)
7. Christopher Flynn (4 out of 6 patents)
8. Chun To Lee (3 out of 3 patents)
9. Timothy William Bray (3 out of 15 patents)
10. William Lee (1 out of 1 patent)
11. William Schaff (1 out of 1 patent)
12. Mark Hiscocks (1 out of 1 patent)
13. Matthew Stewart (1 out of 1 patent)
14. Steven Grant Duvall (1 out of 3 patents)
15. Jordan Roy Nicholls (1 out of 1 patent)
Core Competencies:
Ultrawide Bandgap
Semiconductor Devices
Epitaxial Oxide
Light Emitting Diodes
Optoelectronic Devices
Superlattices
Chirp Layer
Resonant Optical Cavity
Biosensors
Nanowire Devices
Impact Ionization
Material Deposition
72 patents:
Company Overview
Silanna Uv Technologies Pte Ltd is a Singapore-based company specializing in ultrawide bandgap semiconductors. The organization focuses on developing advanced semiconductor devices and epitaxial oxide materials, which are crucial for a range of optoelectronic applications. Their expertise encompasses light-emitting diodes, superlattices, and resonant optical cavities, positioning them at the forefront of innovation in the semiconductor industry. Silanna's commitment to research and development drives advancements in high-performance electronic solutions.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Silanna Uv Technologies Pte Ltd. Retrieved from https://idiyas.com/company/silanna-uv-technologies
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
1 patent (EPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]