The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2025

Filed:

Apr. 08, 2024
Applicant:

Silanna Uv Technologies Pte Ltd, Singapore, SG;

Inventor:

Petar Atanackovic, Henley Beach South, AU;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10H 20/822 (2025.01); H01L 21/02 (2006.01); H01L 23/66 (2006.01); H01S 5/34 (2006.01); H10D 30/01 (2025.01); H10D 30/47 (2025.01); H10D 30/67 (2025.01); H10D 62/80 (2025.01); H10D 62/815 (2025.01); H10D 62/82 (2025.01); H10D 62/85 (2025.01); H10D 64/68 (2025.01); H10H 20/01 (2025.01); H10H 20/811 (2025.01); H10H 20/812 (2025.01); H10H 20/817 (2025.01); H10H 20/818 (2025.01); H10H 20/857 (2025.01); H10H 29/10 (2025.01);
U.S. Cl.
CPC ...
H10H 20/822 (2025.01); H01L 21/02178 (2013.01); H01L 21/02192 (2013.01); H01L 21/02194 (2013.01); H01L 21/0228 (2013.01); H01L 21/02458 (2013.01); H01L 21/02507 (2013.01); H01L 23/66 (2013.01); H01S 5/34 (2013.01); H10D 30/015 (2025.01); H10D 30/6755 (2025.01); H10D 62/80 (2025.01); H10D 62/8161 (2025.01); H10D 62/82 (2025.01); H10D 62/8503 (2025.01); H10D 64/691 (2025.01); H10H 20/01335 (2025.01); H10H 20/811 (2025.01); H10H 20/812 (2025.01); H10H 20/817 (2025.01); H10H 20/818 (2025.01); H10H 20/857 (2025.01); H10H 29/10 (2025.01); H01L 2223/6627 (2013.01); H10D 30/47 (2025.01); H10D 30/475 (2025.01);
Abstract

The techniques described herein relate to a transistor, including a substrate, an epitaxial buffer layer, an epitaxial channel layer, and a gate layer. The substrate includes a first oxide material with a first crystal symmetry, the epitaxial buffer layer includes a second oxide material with a second crystal symmetry, the epitaxial channel layer includes a third oxide material with a third crystal symmetry and a first bandgap, and the gate layer includes a fourth oxide material with a second bandgap. The first crystal symmetry is different from either the second crystal symmetry or the third crystal symmetry, and the second bandgap is wider than the first bandgap. The transistor also includes electrical contacts including a source electrical contact coupled to the epitaxial channel layer, a drain electrical contact coupled to the epitaxial channel layer, and a gate electrical contact coupled to the gate layer.


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