For the Inventor, By the Inventor

Enter assignee name

Hwaseong-si, South Korea

Auros Technology, Inc.

USPTO Granted Patents = 26

Forward Citations = 2

Loading Chart...

Loading Chart...

37 inventors (with patents filed for the assignee):

Hee-Chul Lim (9 out of 9 patents)

Min-Ho Lee (8 out of 8 patents)

Hyun-Kyoo Shon (8 out of 8 patents)

4. Dong-Won Jung (8 out of 8 patents)

5. Sol-Lee Hwang (8 out of 8 patents)

6. Seung Soo Lee (4 out of 4 patents)

7. Hyun Jin Chang (3 out of 3 patents)

8. Hyeon Gi Shin (3 out of 3 patents)

9. Hyo-Sik Ham (3 out of 3 patents)

10. Sung Hoon Hong (2 out of 2 patents)

11. Hyun Chul Lee (2 out of 62 patents)

12. Soo-Yeon Mo (2 out of 2 patents)

13. Seong-Yun Choi (2 out of 2 patents)

14. Gyu Nam Park (2 out of 2 patents)

15. Jae Jun Lee (1 out of 47 patents)

26 patents: Sort by Forward Citations

1. 12483765 - Image acquisition method and device (2025-11-25),

2. 12482688 - Overlay measurement device and method, and system and program therefor (2025-11-25),

3. 12474644 - Device and method for overlay measurement which control focus movement (2025-11-18),

4. 12341047 - Overlay measurement device and method, and system and program therefor (2025-06-24),

5. 12334382 - Overlay measurement device and method, and system and program therefor (2025-06-17),

6. 12244926 - Overlay measurement device and method for controlling focus movement and program storage medium therefor (2025-03-04),

7. 12235590 - Computer-readable storage medium recording data structure for storing data controlling operation of overlay measurement device and overlay measurement device therefor (2025-02-25),

8. 12169365 - Computer-readable storage medium recording data structure for storing data controlling operation of overlay measurement device and overlay measurement device therefor (2024-12-17),

9. 12169364 - Computer-readable storage medium recording data structure for storing data controlling operation of overlay measurement device and overlay measurement device therefor (2024-12-17),

10. 12107052 - Overlay mark forming Moire pattern, overlay measurement method using same, overlay measurement apparatus using same, and manufacturing method of semiconductor device using same (2024-10-01),

11. 12105028 - Apparatus for generating model for spectroscopic ellipsometry constant analysis and method therefor (2024-10-01),

12. 12085383 - Overlay measurement device (2024-09-10),

13. 12066331 - Polarization analysis apparatus and method for adjusting angle of incidence or numerical aperture using aperture (2024-08-20),

14. 12021040 - Overlay mark forming Moire pattern, overlay measurement method using same, and manufacturing method of semiconductor device using same (2024-06-25),

15. 12010425 - Overlay measurement device and method for controlling focus movement and program storage medium therefor (2024-06-11),

Auros Technology, Inc. is a leading provider of innovative technology solutions for businesses worldwide. The company specializes in developing cutting-edge software applications that streamline operations, increase efficiency, and drive growth. With a team of experienced professionals, Auros Technology is committed to delivering high-quality solutions that meet the unique needs of each client. Visit their website to learn more about their services and how they can help your business succeed.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Jan 6 2026

26 Patents

#8 in Hwaseong-si

#495 in South Korea

#24,104 in the World

Hwaseong-si, South Korea

Auros Technology, Inc.

Forward Citations = 2

37 inventors:

Hee-Chul Lim (9 out of 9 patents)

Min-Ho Lee (8 out of 8 patents)

Hyun-Kyoo Shon (8 out of 8 patents)

4. Dong-Won Jung (8 out of 8 patents)

5. Sol-Lee Hwang (8 out of 8 patents)

Please report any incorrect information to support@idiyas.com

Loading…