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Hwaseong, South Korea

Auros Technology, Inc.

USPTO Granted Patents = 30

Forward Citations = 5

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43 inventors (with patents filed for the assignee):

Hee-Chul Lim (9 out of 9 patents)

Sol-Lee Hwang (9 out of 9 patents)

Min-Ho Lee (8 out of 8 patents)

4. Hyun-Kyoo Shon (8 out of 8 patents)

5. Dong-Won Jung (8 out of 8 patents)

6. Seung Soo Lee (4 out of 4 patents)

7. Hyun Jin Chang (3 out of 3 patents)

8. Hyeon Gi Shin (3 out of 3 patents)

9. Hyo-Sik Ham (3 out of 3 patents)

10. Sung Hoon Hong (2 out of 2 patents)

11. Hyun Chul Lee (2 out of 63 patents)

12. Soo-Yeon Mo (2 out of 2 patents)

13. Seong-Yun Choi (2 out of 2 patents)

14. Gyu Nam Park (2 out of 2 patents)

15. Jun Yeob Kim (2 out of 2 patents)

Core Competencies:

Overlay Measurement

Focus Optimization

Wafer Technology

Image Acquisition

Spectroscopic Ellipsometry

Deep Learning

Fiber Optic Light Source

Polarization Analysis

Moire Pattern

Semiconductor Device

Optical Instruments

Data Structure

30 patents: Sort by Forward Citations

1. 12761571 - Overlay measurement apparatus and overlay measurement method (2026-10-13),

2. 12730079 - Overlay measurement apparatus and overlay measurement method (2026-09-08),

3. 12591997 - Arrangement device and method (2026-03-31),

4. 12553712 - Focus optimization for wafer which has multi-peak focus (2026-02-17),

5. 12483765 - Image acquisition method and device (2025-11-25),

6. 12482688 - Overlay measurement device and method, and system and program therefor (2025-11-25),

7. 12474644 - Device and method for overlay measurement which control focus movement (2025-11-18),

8. 12341047 - Overlay measurement device and method, and system and program therefor (2025-06-24),

9. 12334382 - Overlay measurement device and method, and system and program therefor (2025-06-17),

10. 12244926 - Overlay measurement device and method for controlling focus movement and program storage medium therefor (2025-03-04),

11. 12235590 - Computer-readable storage medium recording data structure for storing data controlling operation of overlay measurement device and overlay measurement device therefor (2025-02-25),

12. 12169365 - Computer-readable storage medium recording data structure for storing data controlling operation of overlay measurement device and overlay measurement device therefor (2024-12-17),

13. 12169364 - Computer-readable storage medium recording data structure for storing data controlling operation of overlay measurement device and overlay measurement device therefor (2024-12-17),

14. 12107052 - Overlay mark forming Moire pattern, overlay measurement method using same, overlay measurement apparatus using same, and manufacturing method of semiconductor device using same (2024-10-01),

15. 12105028 - Apparatus for generating model for spectroscopic ellipsometry constant analysis and method therefor (2024-10-01),

Company Overview

Auros Technology, Inc. is a South Korean company specializing in advanced semiconductor technologies and solutions. The organization focuses on the development and manufacturing of innovative materials and components that enhance the performance and efficiency of electronic devices. With a strong emphasis on research and development, Auros Technology aims to contribute to various sectors, including consumer electronics and automotive industries, by providing cutting-edge technology that meets the evolving demands of the market.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 13 2026

30 Patents

#7 in Hwaseong

#456 in South Korea

#21,888 in the World

Hwaseong, South Korea

Auros Technology, Inc.

Forward Citations = 5

43 inventors:

Hee-Chul Lim (9 out of 9 patents)

Sol-Lee Hwang (9 out of 9 patents)

Min-Ho Lee (8 out of 8 patents)

4. Hyun-Kyoo Shon (8 out of 8 patents)

5. Dong-Won Jung (8 out of 8 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Auros Technology, Inc.. Retrieved from https://idiyas.com/company/auros-technology

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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