This inventor holds 5 USPTO granted patents and 1 published patent application. Top assignees: Samsung Display Co., Ltd., Auros Technology, Inc., Coupang, Corporation. Active years: 2017-2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
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Years Active: 2017-2026
Title: Ji Yun Jung: Innovator in Overlay Measurement Technology
Introduction
Ji Yun Jung is a prominent inventor based in Seoul, South Korea. He has made significant contributions to the field of overlay measurement technology, holding a total of 5 patents. His work focuses on enhancing the precision and efficiency of measurement devices used in various applications.
Latest Patents
One of Ji Yun Jung's latest patents is a device and method for overlay measurement that controls focus movement. This innovative overlay measurement device includes a light source that directs illumination to a measurement target containing overlay keys in multiple layers. The device features a lens assembly with an objective lens that condenses illumination on a measurement position and a lens focus actuator that adjusts the distance between the lens and the target. Additionally, a detector captures a focus image based on the reflected beam at the measurement position.
Another notable patent involves a window and display device that incorporates a protective layer on a substrate. This protective layer is composed of specific compounds that enhance the durability and functionality of the window, showcasing Ji Yun Jung's commitment to advancing display technology.
Career Highlights
Ji Yun Jung has worked with leading companies in the technology sector, including Samsung Display Co., Ltd. and Samsung Electronics Co., Ltd. His experience in these organizations has allowed him to develop cutting-edge technologies that have a significant impact on the industry.
Collaborations
Throughout his career, Ji Yun Jung has collaborated with talented individuals such as Jun Yeob Kim and Woo Yong Lim. These partnerships have fostered innovation and contributed to the successful development of his patented technologies.
Conclusion
Ji Yun Jung is a distinguished inventor whose work in overlay measurement technology has led to multiple patents and advancements in the field. His contributions continue to influence the industry and inspire future innovations.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile