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For the Inventor, By the Inventor

Hino, Japan

Tetsuya Ozawa

This inventor holds 22 USPTO granted patents and 6 EPO patents, primarily in X-Ray Analysis. Top assignees: Rigaku Corporation, Calsonic Kansei Corporation. Active years: 2002-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tetsuya Ozawa. Retrieved from https://idiyas.com/inventor/tetsuya-ozawa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 22

% Patents Active = 77.3

 

Average Co-Inventor Count = 2.9

ph-index = 4

Forward Citations = 64(Granted Patents)


Location History:

  • Saitama, JP (2011)
  • Hino, JP (2006 - 2022)
  • Tokyo, JP (2002 - 2024)

Company Filing History:

goldMedal19 out of 301 
 
Rigaku Corporation
 patents
silverMedal3 out of 560 
 
Calsonic Kansei Corporation
 patents

Years Active: 2002-2025

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Areas of Expertise:
X-Ray Analysis
Diffraction Measurement
Quantitative Analysis
Measurement Control
Airtight Box
X-Ray Generator
Data Recording
Scattering Measurement
Fluorescent X-Ray
Airbag Deployment
Crystal Analysis
Optical Components
22 patents (USPTO):Explore Patents
1. 12405390 - Control apparatus, system, method, and program (2025-09-02),
2. 12287301 - Correction amount specifying apparatus, method, program, and jig (2025-04-29),
3. 12175173 - Scattering measurement analysis method, scattering measurement analysis device, and non-transitory computer-readable storage medium storing scattering measurement analysis program (2024-12-24),
4. 12174131 - Quantitative analysis apparatus, method and program and manufacturing control system (2024-12-24),
5. 11942231 - Airtight box for measurement, airtight apparatus, measurement system and measurement apparatus (2024-03-26),
6. 11215571 - X-ray analysis apparatus (2022-01-04),
7. 10900913 - X-ray diffraction apparatus (2021-01-26),
8. 10854348 - X-ray generator and x-ray analysis device (2020-12-01),
9. 10436723 - X-ray diffractometer with multilayer reflection-type monochromator (2019-10-08),
10. 9618461 - X-ray analysis apparatus (2017-04-11),
11. 9490038 - X-ray optical component device and X-ray analyzer (2016-11-08),
12. 9336917 - X-ray apparatus, method of using the same and X-ray irradiation method (2016-05-10),
13. 9074992 - X-ray diffraction apparatus and X-ray diffraction measurement method (2015-07-07),
14. 7896392 - Airbag deployment controller and passenger protection device including the same (2011-03-01),
15. 7860217 - X-ray diffraction measuring apparatus having debye-scherrer optical system therein, and an X-ray diffraction measuring method for the same (2010-12-28),

Title: Tetsuya Ozawa - Innovative Inventor from Hino, Japan

Introduction: Tetsuya Ozawa is a renowned inventor hailing from Hino, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Tetsuya Ozawa holds several patents in the areas of robotics, artificial intelligence, and sustainable energy solutions, showcasing his versatility and forward-thinking approach to invention.

Career Highlights: With over two decades of experience in the industry, Tetsuya Ozawa has worked with leading tech companies and research institutions, consistently pushing the boundaries of what is possible through his inventive creations.

Collaborations: Throughout his career, Tetsuya Ozawa has collaborated with top engineers, scientists, and designers from around the world, fostering a culture of innovation and excellence in all his projects.

Conclusion: Tetsuya Ozawa's passion for innovation and his relentless pursuit of technological advancement continue to inspire the next generation of inventors and shape the future of technology worldwide.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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