The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 11, 2017

Filed:

Oct. 10, 2013
Applicant:

Rigaku Corporation, Akishima-shi, JP;

Inventors:

Takao Ohara, Ome, JP;

Kenji Wakasaya, Akishima, JP;

Tetsuya Ozawa, Hino, JP;

Kunio Nishi, Hachioji, JP;

Assignee:

RIGAKU CORPORATION, Akishima-Shi, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/20 (2006.01); G01T 7/00 (2006.01);
U.S. Cl.
CPC ...
G01N 23/20008 (2013.01); G01T 7/00 (2013.01); G01N 2223/30 (2013.01); G01N 2223/308 (2013.01);
Abstract

An X-ray analysis apparatus for detecting, using an X-ray detector, X-rays given off by a sample when the sample is irradiated with X-rays, the X-ray analysis apparatus having replaceable components. The X-ray analysis apparatus comprises labels attached to the replaceable components and including symbols indicating the types of replaceable components, a camera for photographing the replaceable components and the labels, and CPU and image recognition software for specifying the types of replaceable components by calculation based on the symbols in the labels.


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