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Akishima, Japan

Rigaku Corporation

USPTO Granted Patents = 284

EPO Patents = 119

Trademarks = 20

Forward Citations = 1,218

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227 inventors (with patents filed for the assignee):

Kazuhiko Omote (50 out of 51 patents)

Tetsuya Ozawa (19 out of 22 patents)

Yoshiyasu Ito (18 out of 23 patents)

4. Takuto Sakumura (16 out of 16 patents)

5. Yoshiyuki Kataoka (13 out of 17 patents)

6. Masaru Kuribayashi (13 out of 28 patents)

7. Takashi Sato (12 out of 160 patents)

8. Kiyoshi Ogata (12 out of 51 patents)

9. Hideo Toraya (12 out of 12 patents)

10. Katsuhiko Inaba (11 out of 12 patents)

11. Masahiro Nonoguchi (11 out of 12 patents)

12. Licai Jiang (10 out of 28 patents)

13. Yasukazu Nakaye (10 out of 10 patents)

14. Yukihiro Hara (9 out of 22 patents)

15. Hiroshi Motono (9 out of 9 patents)

Core Competencies:

X-Ray Diffraction

Thermal Analysis

Fluorescence Spectrometry

Single-Crystal Analysis

Quantitative Analysis

Evolved Gas Analysis

Scattering Measurement

Crystallinity Measurement

Imaging X-Ray Microscopy

Pulse Height Prediction

Sample Holder Design

Battery Analysis

284 patents: Sort by Forward Citations

1. 12523624 - Peak identification analysis program, and X-ray fluorescent spectrometer (2026-01-13),

2. 12487195 - Detector stand and X-ray diffraction apparatus (2025-12-02),

3. 12405390 - Control apparatus, system, method, and program (2025-09-02),

4. 12405235 - Degree-of-crystallinity measurement apparatus, degree-of-crystallinity measurement method, and information storage medium (2025-09-02),

5. 12399141 - Damage measurement method, apparatus and program, and x-ray diffraction apparatus (2025-08-26),

6. 12392666 - Thermal analysis apparatus and control software for thermal analysis apparatus (2025-08-19),

7. 12385860 - X-ray fluorescence spectrometer (2025-08-12),

8. 12313573 - X-ray diffraction apparatus and measurement method (2025-05-27),

9. D1075541 - Interface for evolved gas analyzer (2025-05-20),

10. 12287301 - Correction amount specifying apparatus, method, program, and jig (2025-04-29),

11. 12287300 - Device and method for analyzing diffraction pattern of mixture, and information storage medium (2025-04-29),

12. 12247935 - X-ray fluorescence spectrometer (2025-03-11),

13. 12235229 - X-ray fluorescence spectrometer (2025-02-25),

14. 12222303 - Transmissive small-angle scattering device (2025-02-11),

15. 12196690 - Structure information acquisition method and structure information acquisition apparatus (2025-01-14),

RIGAKU CORPORATION is a leading global scientific instrumentation company that provides analytical and industrial testing solutions. With a focus on X-ray technology, Rigaku develops and manufactures cutting-edge instruments for various industries, including healthcare, pharmaceuticals, and materials science. The company aims to contribute to society by offering highly reliable and innovative products to meet customer needs.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Jan 13 2026

284 Patents

#2 in Akishima

#541 in Japan

#3,031 in the World

Akishima, Japan

Rigaku Corporation

Forward Citations = 1,218

227 inventors:

Kazuhiko Omote (50 out of 51 patents)

Tetsuya Ozawa (19 out of 22 patents)

Yoshiyasu Ito (18 out of 23 patents)

4. Takuto Sakumura (16 out of 16 patents)

5. Yoshiyuki Kataoka (13 out of 17 patents)

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