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Rigaku Corporation

USPTO Granted Patents = 301

% Expired Patents = 24.9

EPO Patents = 129

Trademarks = 16

Forward Citations = 1,249

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251 inventors (with patents filed for the assignee):

Kazuhiko Omote (50 out of 51 patents)

Yoshiyasu Ito (20 out of 25 patents)

Tetsuya Ozawa (19 out of 22 patents)

4. Takuto Sakumura (17 out of 17 patents)

5. Yoshiyuki Kataoka (13 out of 17 patents)

6. Takashi Sato (13 out of 163 patents)

7. Masaru Kuribayashi (13 out of 28 patents)

8. Kiyoshi Ogata (12 out of 51 patents)

9. Hideo Toraya (12 out of 12 patents)

10. Akihiro Himeda (11 out of 11 patents)

11. Yasukazu Nakaye (11 out of 11 patents)

12. Katsuhiko Inaba (11 out of 12 patents)

13. Masahiro Nonoguchi (11 out of 12 patents)

14. Licai Jiang (10 out of 28 patents)

15. Yukihiro Hara (9 out of 22 patents)

Core Competencies:

X-Ray Fluorescence

Diffraction Apparatus

Single-Crystal Analysis

Crystal Structure

Spectrometer

Thermal Analysis

Quantitative Analysis

Emission Spectrochemical

Measurement Device

Data Processing

X-Ray Generation

Scattering Measurement

301 patents: Sort by Forward Citations

1. 12704468 - Control apparatus, system, method and program (2026-08-11),

2. 12699062 - Analysis apparatus, analysis method, and analysis program (2026-08-04),

3. 12687510 - Analysis apparatus, system, method, and program (2026-07-21),

4. 12669621 - Radiation detector, radiation measuring apparatus, and method for setting radiation detector (2026-06-30),

5. 12669451 - Correction apparatus, correction method, and correction program (2026-06-30),

6. 12669450 - Correction apparatus, system, method, and program (2026-06-30),

7. 12633023 - Correction apparatus, method and program for correcting artifacts (2026-05-19),

8. 12626440 - Correction apparatus, system, method, and program (2026-05-12),

9. 12625143 - X-ray contrast medium and X-ray image acquisition method (2026-05-12),

10. 12607580 - Sample holder (2026-04-21),

11. 12601696 - Crystal structure analysis method, crystal structure analysis device, and crystal structure analysis program (2026-04-14),

12. D1120783 - Measuring device for x-ray emission spectrochemical analysis (2026-03-31),

13. 12584871 - Information processing apparatus, information processing method, nontransitory computer readable media storing program, and X-ray analysis apparatus (2026-03-24),

14. D1116883 - Measuring device for x-ray emission spectrochemical analysis (2026-03-10),

15. 12566146 - Information processing apparatus, information processing method, non-transitory computer readable media storing program, and X-ray analysis apparatus (2026-03-03),

Company Overview

Rigaku Corporation, headquartered in Tokyo, Japan, is a leader in the field of X-ray analysis technology. The company specializes in the development and manufacturing of advanced instruments for X-ray fluorescence, diffraction apparatus, and single-crystal analysis. Rigaku's innovative solutions are widely used in various industries, including materials science, chemistry, and pharmaceuticals, enabling precise crystal structure determination and quantitative analysis. Their commitment to research and development ensures they remain at the forefront of analytical instrumentation.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

301 Patents

#282 in Tokyo

#544 in Japan

#2,978 in the World

Rigaku Corporation

Forward Citations = 1,249

251 inventors:

Kazuhiko Omote (50 out of 51 patents)

Yoshiyasu Ito (20 out of 25 patents)

Tetsuya Ozawa (19 out of 22 patents)

4. Takuto Sakumura (17 out of 17 patents)

5. Yoshiyuki Kataoka (13 out of 17 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Rigaku Corporation. Retrieved from https://idiyas.com/company/rigaku

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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