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For the Inventor, By the Inventor

Akishima, Japan

Rigaku Corporation


USPTO Granted Patents = 283


Trademarks = 20

Forward Citations = 1,217

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227 inventors (with patents filed for the assignee):

goldMedal Kazuhiko Omote (50 out of 51 patents)

silverMedal Tetsuya Ozawa (19 out of 22 patents)

bronzeMedal Yoshiyasu Ito (18 out of 23 patents)

4.  Takuto Sakumura (16 out of 16 patents)

5.  Masaru Kuribayashi (13 out of 28 patents)

6.  Yoshiyuki Kataoka (12 out of 16 patents)

7.  Takashi Sato (12 out of 160 patents)

8.  Kiyoshi Ogata (12 out of 51 patents)

9.  Hideo Toraya (12 out of 12 patents)

10.  Katsuhiko Inaba (11 out of 12 patents)

11.  Masahiro Nonoguchi (11 out of 12 patents)

12.  Licai Jiang (10 out of 28 patents)

13.  Yasukazu Nakaye (10 out of 10 patents)

14.  Yukihiro Hara (9 out of 22 patents)

15.  Hiroshi Motono (9 out of 9 patents)


Core Competencies:
X-Ray Diffraction
Thermal Analysis
Fluorescence Spectrometry
Single-Crystal Analysis
Quantitative Analysis
Evolved Gas Analysis
Scattering Measurement
Crystallinity Measurement
Imaging X-Ray Microscopy
Pulse Height Prediction
Sample Holder Design
Battery Analysis

283 patents:

1. 12487195 - Detector stand and X-ray diffraction apparatus (2025-12-02),
2. 12405390 - Control apparatus, system, method, and program (2025-09-02),
3. 12405235 - Degree-of-crystallinity measurement apparatus, degree-of-crystallinity measurement method, and information storage medium (2025-09-02),
4. 12399141 - Damage measurement method, apparatus and program, and x-ray diffraction apparatus (2025-08-26),
5. 12392666 - Thermal analysis apparatus and control software for thermal analysis apparatus (2025-08-19),
6. 12385860 - X-ray fluorescence spectrometer (2025-08-12),
7. 12313573 - X-ray diffraction apparatus and measurement method (2025-05-27),
8. D1075541 - Interface for evolved gas analyzer (2025-05-20),
9. 12287301 - Correction amount specifying apparatus, method, program, and jig (2025-04-29),
10. 12287300 - Device and method for analyzing diffraction pattern of mixture, and information storage medium (2025-04-29),
11. 12247935 - X-ray fluorescence spectrometer (2025-03-11),
12. 12235229 - X-ray fluorescence spectrometer (2025-02-25),
13. 12222303 - Transmissive small-angle scattering device (2025-02-11),
14. 12196690 - Structure information acquisition method and structure information acquisition apparatus (2025-01-14),
15. 12175173 - Scattering measurement analysis method, scattering measurement analysis device, and non-transitory computer-readable storage medium storing scattering measurement analysis program (2024-12-24),
RIGAKU CORPORATION is a leading global scientific instrumentation company that provides analytical and industrial testing solutions. With a focus on X-ray technology, Rigaku develops and manufactures cutting-edge instruments for various industries, including healthcare, pharmaceuticals, and materials science. The company aims to contribute to society by offering highly reliable and innovative products to meet customer needs.
This text is generated by artificial intelligence and may not be accurate.

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USPTO Data Jan 1 1976 - Dec 30 2025

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283 Patents

#2 in Akishima

#541 in Japan

#3,036 in the World

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Akishima, Japan

Rigaku Corporation

Forward Citations = 1,217

227 inventors:

goldMedal Kazuhiko Omote (50 out of 51 patents)

silverMedal Tetsuya Ozawa (19 out of 22 patents)

bronzeMedal Yoshiyasu Ito (18 out of 23 patents)

4.  Takuto Sakumura (16 out of 16 patents)

5.  Masaru Kuribayashi (13 out of 28 patents)

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