The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2026

Filed:

Mar. 26, 2024
Applicant:

Rigaku Corporation, Tokyo, JP;

Inventors:

Rieko Suenaga, Akishima, JP;

Yoshiyasu Ito, Akishima, JP;

Assignee:

RIGAKU CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/2252 (2018.01); G01N 23/2055 (2018.01);
U.S. Cl.
CPC ...
G01N 23/2252 (2013.01); G01N 23/2055 (2013.01);
Abstract

An analysis apparatus for calculating an index indicating an optimization degree of a model with respect to measurement data includes processing circuitry configured to calculate an index indicating an optimization degree of a model including information of an electron density distribution with respect to measurement data, a probability distribution function followed by the measurement data being known, acquire the measurement data, acquire calculation data calculated from the model, and calculate an index GOF including a ratio of a residual, which is defined by a predetermined mathematical formula including the measurement data and the calculation data, and an expected value of the residual, which is defined based on the probability distribution function and the predetermined mathematical formula.


Find Patent Forward Citations

Suenaga, Rieko. (2026). Analysis apparatus, system, method, and program (U.S. Patent No. 12687510). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12687510

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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