Rochester Hills, MI, United States of America

Licai Jiang

USPTO Granted Patents = 28 (Patent Applications = 2)

CIPO Patents = 4 (Patent Applications = 3)

EPO Patents = 11 (Patent Applications = 9)

Average Co-Inventor Count = 2.0

ph-index = 10

Forward Citations = 317(Granted Patents)

Location History:

Troy, MI (US) (2000)
Rochester Hill, MI (US) (2012)
Rochester Hills, MI (US) (2000 - 2020)
Auburn Hills, MI (US) (2019 - 2024)

Company Filing History:

Rigaku Innovative Technologies, Inc.

Years Active: 2000-2024

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28 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 11867646 - Total reflection x-ray fluorescence spectrometer (2024-01-09),

2. 10876978 - X-ray inspecting device, X-ray thin film inspecting method, and method for measuring rocking curve (2020-12-29),

3. 10854348 - X-ray generator and x-ray analysis device (2020-12-01),

4. 10436723 - X-ray diffractometer with multilayer reflection-type monochromator (2019-10-08),

5. 10429325 - X-ray small angle optical system (2019-10-01),

6. 9575017 - High performance Kratky assembly (2017-02-21),

7. 9336917 - X-ray apparatus, method of using the same and X-ray irradiation method (2016-05-10),

8. 9159524 - X-ray generating apparatus (2015-10-13),

9. 9031203 - X-ray beam system offering 1D and 2D beams (2015-05-12),

10. 9014335 - Dual mode small angle scattering camera (2015-04-21),

11. 8767918 - X-ray scattering measurement device and X-ray scattering measurement method (2014-07-01),

12. 8249220 - Multiconfiguration X-ray optical system (2012-08-21),

13. 8126117 - Multi-beam X-ray system (2012-02-28),

14. 8111807 - Crystallite size analysis method and apparatus using powder X-ray diffraction (2012-02-07),

15. 8094780 - Two dimensional small angle X-Ray scattering camera (2012-01-10),

Title: Licai Jiang: A Pioneer in X-ray Technology

Introduction

Licai Jiang is an innovative inventor based in Rochester Hills, MI, with an impressive record of 28 patents to his name. His work primarily focuses on enhancing X-ray technology, leading to advancements in analysis sensitivity and speed. Through his contributions, Jiang has paved the way for more efficient and effective methods in X-ray inspection and measurement.

Latest Patents

Among Licai Jiang's most notable inventions is the "Total Reflection X-ray Fluorescence Spectrometer." This device provides high analysis sensitivity and speed, utilizing an X-ray source with a specific electron beam focal point. The spectrometer incorporates a reflective optic with a curved surface and multiple detectors arranged efficiently to measure fluorescent X-rays emitted from samples.

Another significant patent involves an "X-ray Inspecting Device" that utilizes both vertical and horizontal X-ray optical elements. The first element employs a crystal material with high crystallinity, while the second utilizes a multilayer mirror. This innovative approach ensures a precise and effective inspection process.

Career Highlights

Licai Jiang has made substantial contributions to the field of X-ray technology through his roles at companies such as Rigaku Corporation and Rigaku Innovative Technologies, Inc. His tenure in these organizations allowed him to refine his innovative skills and work on cutting-edge projects that have had a lasting impact in his area of expertise.

Collaborations

Throughout his career, Licai Jiang has collaborated with esteemed colleagues, including Boris Verman and Kazuhiko Omote. These collaborations have fostered an environment of innovation and creativity, pushing the boundaries of what is possible in X-ray technology.

Conclusion

Licai Jiang’s contributions to the realm of X-ray technology through his numerous patents exemplify his commitment to innovation and excellence. As he continues to explore new avenues in research and development, his work will undoubtedly leave a lasting legacy in the field of scientific analysis and inspection methods.

This text is generated by artificial intelligence and may not be accurate.