The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2015
Filed:
Jun. 07, 2013
Applicant:
Rigaku Innovative Technologies, Inc., Auburn Hills, MI (US);
Inventors:
Licai Jiang, Rochester Hills, MI (US);
Boris Verman, Bloomfield, MI (US);
Assignee:
Rigaku Innovative Technologies, Inc., Auburn Hills, MI (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G21K 1/06 (2006.01); G01N 23/201 (2006.01);
U.S. Cl.
CPC ...
G21K 1/067 (2013.01); G01N 23/201 (2013.01); G21K 2201/064 (2013.01);
Abstract
A system for analyzing a sample is provided. The system includes an optical system capable of providing a one-dimensional beam and a two-dimensional beam. The system may include a beam selection device to select between providing a one-dimensional x-ray beam to the sample in a one-dimensional operation mode and a two-dimensional x-ray beam to the sample in a two-dimensional operation mode.