Bloomfield, MI, United States of America

Boris Verman

USPTO Granted Patents = 22 

 

 

Average Co-Inventor Count = 2.5

ph-index = 10

Forward Citations = 289(Granted Patents)


Location History:

  • Troy, MI (US) (2000 - 2002)
  • Bloomfield Hills, MI (US) (2013)
  • Bloomfield, MI (US) (2003 - 2020)
  • Auburn Hills, MI (US) (2019 - 2024)

Company Filing History:


Years Active: 2000-2024

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22 patents (USPTO):Explore Patents

Title: Innovations and Contributions of Boris Verman in X-Ray Instrumentation

Introduction: Boris Verman, a notable inventor based in Bloomfield, MI, has made significant strides in the field of X-ray instrumentation. With a remarkable portfolio of 22 patents, Verman's work demonstrates a commitment to enhancing analysis sensitivity and speed in scientific applications.

Latest Patents: Among his latest innovations is the Total Reflection X-Ray Fluorescence Spectrometer. This advanced spectrometer boasts high analysis sensitivity and speed, incorporating a unique X-ray source designed with a focused electron beam and an effective width that surpasses the sample dimension in the irradiation direction. The spectrometer features reflective optics with a larger effective width, complemented by multiple detectors arranged to efficiently measure the intensities of fluorescent X-rays emitted from samples. Another innovative patent includes an X-ray inspection device and X-ray thin film inspecting method which employs a dual optical element focus system to enhance the clarity and precision of X-ray analysis. This system employs a high-crystallinity crystal material and a multilayer mirror to focus characteristic X-rays both vertically and horizontally, providing detailed inspection capabilities.

Career Highlights: Over the years, Boris Verman has contributed to the fields of physics and material science while working with reputable companies such as Osmic, Inc. and Rigaku Corporation. His role in these organizations has been pivotal in advancing X-ray technologies, directly impacting various research and industrial applications.

Collaborations: Verman has collaborated with esteemed colleagues such as Licai Jiang and Kazuhiko Omote. Their joint efforts have played a significant role in the development of groundbreaking X-ray inspection technologies and methodologies, showcasing the strength of teamwork in scientific innovation.

Conclusion: Boris Verman's extensive contributions to the field of X-ray instrumentation exemplify the essence of innovation. With a focused approach towards developing highly sensitive and efficient analytical tools, his patents stand as a testament to his expertise and dedication to advancing scientific technology. As Verman continues to push the boundaries of research and development, his work undoubtedly paves the way for future innovations in the field.

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