The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2012

Filed:

Feb. 03, 2010
Applicants:

Boris Verman, Bloomfield, MI (US);

Michael Young, Canton, MI (US);

Licai Jiang, Rochester Hill, MI (US);

Inventors:

Boris Verman, Bloomfield, MI (US);

Michael Young, Canton, MI (US);

Licai Jiang, Rochester Hill, MI (US);

Assignee:

Rigaku Innovative Technologies, Inc., Auburn Hills, MI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 35/04 (2006.01); H01J 35/30 (2006.01); G21K 1/00 (2006.01); G21K 1/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A multi-beam x-ray system includes an x-ray source which emits x-rays and a housing with a first part and a second part. The second part is moveable relative to the first part and includes a plurality of optics of different performance characteristics. Each optic, through the movement of the second part relative to the first part, is positioned to a working position so that the optic receives the x-rays from the x-ray source and directs the x-rays with the desired performance attributes to a desired location.


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