The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2026

Filed:

Mar. 21, 2024
Applicant:

Rigaku Corporation, Tokyo, JP;

Inventor:

Yoshiyasu Ito, Akishima, JP;

Assignee:

RIGAKU CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/201 (2018.01); G01N 23/20025 (2018.01);
U.S. Cl.
CPC ...
G01N 23/201 (2013.01); G01N 23/20025 (2013.01); G01N 2223/041 (2013.01); G01N 2223/054 (2013.01);
Abstract

An analysis apparatus includes processing circuitry configured to store data of a scattering intensity measured by transmission of X-rays in one ω scan, perform coordinate conversion from the coordinate of the scattering vector to the coordinate of the tilt of the scattering body, with respect to a waveform based on the intensity of a specific diffraction point on the two-direction components, specify a peak position of the waveform of the intensity with respect to the coordinate of the tilt applied the coordinate conversion, and calculate a difference between the specified peak position and the peak position obtained on the assumption that the scattering body is not tilted from the direction perpendicular to the surface of the plate-shaped sample.


Find Patent Forward Citations

Ito, Yoshiyasu. (2026). Analysis apparatus, analysis method, and analysis program (U.S. Patent No. 12699062). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12699062

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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