The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2026
Filed:
Feb. 21, 2023
Rigaku Corporation, Tokyo, JP;
RIGAKU CORPORATION, Tokyo, JP;
Abstract
A control apparatus, system, method, and program are provided that can efficiently acquire data significant for specifying the structure of a macromolecule in solution with a resolution greater than 30 Å. A control apparatus for controlling an X-ray analysis apparatus comprises a data converting section for converting sample solution data and reference solution data acquired from an X-ray analysis apparatus into profiles at each time, a first index calculating section for calculating a first index representing fluctuation in intensity calculated from a relationship between time and the intensity based on at least a profile of solution data of the converted profiles, a first index determining section for determining whether or not the calculated first index is within a predetermined range, and an apparatus controlling section for terminating measurement by the X-ray analysis apparatus when the first index is not within the predetermined range.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile