The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2015

Filed:

Dec. 05, 2011
Applicants:

Tetsuya Ozawa, Hino, JP;

Ryuji Matsuo, Hino, JP;

Katsuhiko Inaba, Ome, JP;

Inventors:

Tetsuya Ozawa, Hino, JP;

Ryuji Matsuo, Hino, JP;

Katsuhiko Inaba, Ome, JP;

Assignee:

RIGAKU CORPORATION, Akishima-Shi, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/207 (2006.01); G01N 23/20 (2006.01);
U.S. Cl.
CPC ...
G01N 23/207 (2013.01);
Abstract

There is provided an X-ray diffraction apparatus comprising an X-ray topography device for providing a spatial geometric correspondence to an X-ray exiting from a planar region of a sample to detect the X-ray as a planar X-ray topograph, and outputting the X-ray topograph as a signal; a two-dimensional imaging device for receiving a light-image of the planar region of the sample and outputting the light-image as a signal specified by planar positional information; and a video-synthesizing arithmetic control device for generating synthesized video data on the basis of an output signal from the X-ray topograph and an output signal from the imaging device.


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