The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 26, 2024
Filed:
Nov. 17, 2020
Applicant:
Rigaku Corporation, Akishima, JP;
Inventors:
Assignee:
RIGAKU CORPORATION, Akishima, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G21F 7/04 (2006.01); G01N 23/20016 (2018.01); G01N 23/20025 (2018.01); G21F 7/047 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G21F 7/04 (2013.01); G21F 7/047 (2013.01); G01N 23/20016 (2013.01); G01N 23/20025 (2013.01); G01N 35/00 (2013.01); G01N 2035/00277 (2013.01);
Abstract
An airtight apparatus in which an airtight box () for measurement is combined with a glove box () is provided. The airtight box () for measurement includes a hollow housing (), and a sample stage () having a sample loading portion. The sample stage () is transported by a transport stage () installed in the housing (). The housing () is provided with a measurement window () for measuring a sample loaded on the sample stage () from the outside by a measurement apparatus ().
Ito, Koichiro. (2024). Airtight box for measurement, airtight apparatus, measurement system and measurement apparatus (U.S. Patent No. 11942231). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11942231
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile