The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2021
Filed:
Aug. 04, 2017
Applicant:
Rigaku Corporation, Tokyo, JP;
Inventors:
Takeshi Osakabe, Tokyo, JP;
Tetsuya Ozawa, Tokyo, JP;
Assignee:
RIGAKU CORPORATION, Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/20 (2018.01); G01N 23/04 (2018.01); G01N 23/20008 (2018.01); G01N 23/20025 (2018.01); G01N 23/201 (2018.01); G01N 23/207 (2018.01);
U.S. Cl.
CPC ...
G01N 23/20075 (2013.01); G01N 23/04 (2013.01); G01N 23/201 (2013.01); G01N 23/207 (2013.01); G01N 23/20008 (2013.01); G01N 23/20025 (2013.01); G01N 2223/33 (2013.01);
Abstract
An X-ray diffraction apparatus including an X-ray detector that is configured to detect diffracted X-rays diffracted from a sample when a surface of the sample is irradiated with X-rays, a counter arm which rotates around a rotation center axis set within the surface of the sample while the X-ray detector is installed on the counter arm, and a plate-like X-ray shielding member that is installed on the counter arm and rotated together with the X-ray detector.