Rigaku Corporation

Calsonic Kansei Corporation

Tetsuya Ozawa

Ryuji Matsuo

Kazuhiko Omote

Takeshi Osakabe

Licai Jiang

Boris Verman

Katsuhiko Inaba

Jimpei Harada

Kenji Wakasaya

Susumu Yamaguchi

Takuto Sakumura

Yuriy Platonov

Yasukazu Nakaye

Kazuyuki Matsushita

Akihiro Himeda

Koichiro Ito

Go Fujinawa

Ryouichi Yokoyama

Kazuki Ito

Kamihisa Endo

Atsushi Ohbuchi

Akira Echizenya

Kunio Nishi

Toshinori Yagi

Takayuki Konya

Tomoyuki Iwata

Tohru Oowada

Takao Ohara

Kohji Kakefuda

Takuya Kikuchi

Takeshi Ozawa

Miki Kasari

Takahiro Kuzumaki

Kazuki Omoto

Makoto Aoyagi

Ryuichi Asada

Mineyuki Ooishi

A control apparatus, system, method and program that enable simultaneous measurement of counts of multiple energy ranges in an efficient configuration are provided. A control apparatusfor controlling an X-ray detectorand outputting a measurement result comprises a setting sectionconfigured to set the energy range of X-rays to be detected for each unit region of the X-ray detector, a data management sectionconfigured to acquire a count value of the set energy range for each unit region as measurement data by a result of the X-ray measurement, and an outputting sectionconfigured to output the measurement data. Thus, counting of multiple energy ranges can simultaneously be measured.

Control apparatus, system, method, and program

A correction amount specifying apparatus comprises circuitry for storing diffraction data including a combination of the diffraction angle of the irradiation X-rays with respect to the sample rotation angle and the sample surface height, the diffraction data being acquired by irradiating X-rays to a standard sample that is an aggregate of isotropic and stress free crystal particles, determining a first correspondence relationship based on the diffraction data, and specifying a correction amount of the sample surface height with respect to a desired sample rotation angle and a desired diffraction angle based on the first correspondence relationship.

Correction amount specifying apparatus, method, program, and jig

A quantitative analysis apparatus, a method, a program, and a manufacturing control system are provided. A WPPF sectionfor determining parameters of theoretical diffraction intensity by performing whole powder pattern fitting with respect to an X-ray diffraction profile to be analyzed, a scale factor acquiring sectionfor acquiring a scale factor of a test component among the determined parameters, a calibration curve storing sectionfor storing a calibration curve indicating a correlation between scale factors of the test component acquired with respect to a standard sample and content ratios of the test component in the standard sample, and a conversion sectionfor converting the scale factor of the test component acquired with respect to an objective sample into the content ratio of the test component in the objective sample using the stored calibration curve, are comprised.

Quantitative analysis apparatus, method and program and manufacturing control system

Provided is a scattering measurement analysis method including obtaining a theoretical scattering intensity from a structural model that contains a lot of scatterers, wherein the obtaining of a theoretical scattering intensity includes obtaining a contribution to the theoretical scattering intensity of a pair of a scatterer 'm' and a scatterer “n” existing at a distance “r” from the scatterer “m” among a plurality of scatterers by at least one of calculations in accordance with the distance “r”, the calculations including a first calculation of calculating contributions of the scatterer “m” and the scatterer “n” from respective scattering factors f(q) and f*(q) and a center-to-center distance rbetween the scatterer “m” and the scatterer “n”, and a second calculation of substituting the scattering factor f*(q) of the scatterer “n” by a first representative value and substituting a probability density function of the number of scatterers existing at the distance “r” by a constant value.

Scattering measurement analysis method, scattering measurement analysis device, and non-transitory computer-readable storage medium storing scattering measurement analysis program

An airtight apparatus in which an airtight box () for measurement is combined with a glove box () is provided. The airtight box () for measurement includes a hollow housing (), and a sample stage () having a sample loading portion. The sample stage () is transported by a transport stage () installed in the housing (). The housing () is provided with a measurement window () for measuring a sample loaded on the sample stage () from the outside by a measurement apparatus ().

Airtight box for measurement, airtight apparatus, measurement system and measurement apparatus

Provided is an X-ray analysis apparatus including: a goniometer including an incident-side arm extending in a first direction, a fixing portion, and a receiving-side arm; an X-ray source portion, which is arranged on the incident-side arm and generates an X-ray source extending in a second direction, which crosses the first direction; a support base, which is arranged on the fixing portion, and is configured to support a sample; a parallel slit, which is arranged on the fixing portion, and is configured to limit a line width along the second direction of the X-ray source generated by the X-ray source portion; and a detector, which is arranged on the receiving-side arm, and is configured to detect a scattered X-ray generated by the sample.

X-ray analysis apparatus

An X-ray diffraction apparatus including an X-ray detector that is configured to detect diffracted X-rays diffracted from a sample when a surface of the sample is irradiated with X-rays, a counter arm which rotates around a rotation center axis set within the surface of the sample while the X-ray detector is installed on the counter arm, and a plate-like X-ray shielding member that is installed on the counter arm and rotated together with the X-ray detector.

X-ray diffraction apparatus

An X-ray generator includes: a line X-ray source; a multilayer film mirror; and a side-by-side reflecting mirror including two concave mirrors joined together so as to share a join line. A cross section of a reflecting surface of the multilayer film mirror has a parabolic shape, and a focus of the parabolic shape is located at the line X-ray source. Cross sections of reflecting surfaces of the two concave mirrors of the side-by-side reflecting mirror each have a parabolic shape, and each of focuses of the parabolic shapes is located on a side opposite to the multilayer film mirror. An extended line of the join line of the side-by-side reflecting mirror passes through the multilayer film mirror and the line X-ray source as viewed in a plan view.

X-ray generator and x-ray analysis device

Only X-rays having a specific wavelength, selected from a group of focusing X-rays diffracted from a sample, are reflected from a monochromator based on a Bragg's condition, passed through a receiving slit and detected by an X-ray detector. The monochromator is configured to be freely removable, and arranged between the sample and a focal point at which the wavelength-selected focusing X-rays diffracted from the sample are directly focused. At this time, the monochromator is moved so as to position the monochromator as close to the focal point as possible. The monochromator comprises a multilayer mirror having an internal interplanar spacing, wherein said internal interplanar spacing varies continuously from one end of the monochromator to the other end.

X-ray diffractometer with multilayer reflection-type monochromator

An X-ray analysis apparatus for detecting, using an X-ray detector, X-rays given off by a sample when the sample is irradiated with X-rays, the X-ray analysis apparatus having replaceable components. The X-ray analysis apparatus comprises labels attached to the replaceable components and including symbols indicating the types of replaceable components, a camera for photographing the replaceable components and the labels, and CPU and image recognition software for specifying the types of replaceable components by calculation based on the symbols in the labels.

An X-ray optical component device having an X-ray optical component unit, a motor controller, and a connector. The connector has motor pins and motor terminals electrically connected to a motor when engaged with each other, and a signal pin and signal terminal for sensing detachment of the connector, the signal pin and signal terminal being capable of engaging with each other. A pin-side connector and a terminal-side connector are detachable. When the pin-side connector is detached from the terminal-side connector, the time that the signal pin is removed from the signal terminal is earlier than the time that the motor pins are removed from the motor terminals. During replacement of an X-ray optical component unit equipped with a motor for adjusting the position of an X-ray optical component, unwanted movement of the position of the X-ray optical component provided in the unit is prevented.

X-ray optical component device and X-ray analyzer

An X-ray apparatus that creates a virtual source having a narrow energy bandwidth and enables a high-resolution X-ray diffraction measurement; a method of using the same; and an X-ray irradiation method are provided. An X-ray apparatusincludes a monochromatorthat focuses a divergent X-ray beam while dispersing it and a selection partthat is installed in a condensing position of the condensed X-ray beam for selecting an X-ray beam having a wavelength in a specific range, allowing it to pass through, and creating a virtual source. With this arrangement, it is possible to create a virtual source having a narrow energy bandwidth at a focal pointand by means of the virtual source a high-resolution X-ray diffraction measurement is available. By using the X-ray apparatus, it is possible to sufficiently separate an X-ray beam having such an extremely narrow energy bandwidth as, for example, K&#x3b1;1 ray from K&#x3b1;2 ray. In addition, it is also possible to cut out part of continuous X-ray beams to create a virtual source.

X-ray apparatus, method of using the same and X-ray irradiation method

There is provided an X-ray diffraction apparatus comprising an X-ray topography device for providing a spatial geometric correspondence to an X-ray exiting from a planar region of a sample to detect the X-ray as a planar X-ray topograph, and outputting the X-ray topograph as a signal; a two-dimensional imaging device for receiving a light-image of the planar region of the sample and outputting the light-image as a signal specified by planar positional information; and a video-synthesizing arithmetic control device for generating synthesized video data on the basis of an output signal from the X-ray topograph and an output signal from the imaging device.

X-ray diffraction apparatus and X-ray diffraction measurement method

An airbag deployment controller and a passenger protection device including the same are provided to prevent erroneous (false) operation of an airbag due to noises and quickly deploy the airbag. The passenger protection device determines whether or not to drive an airbag unit, upon determining a detected value of a front acceleration sensor as being over a first collision threshold. Then, when determining to drive the airbag unit, the passenger protection device determines whether or not a detected value of a central acceleration sensor exceeds a second collision threshold. With the detected value being over the second threshold, it generates a driving signal and outputs it to the airbag unit in a final deployment control process. Thereby, the airbag unit operates an inflator to drive an airbag.

Airbag deployment controller and passenger protection device including the same

An X-ray diffraction measuring apparatus equipped with Debye-Scherrer optical system therein, comprises a generator for generating a characteristic X-ray to be irradiated upon a sample to be measured; an X-ray detector being disposed to surround that sample around; and a focusing arrangement, being disposed between the sample and the X-ray detector, for collecting an X-ray scattering from the sample covering over a predetermined angle, in a peripheral direction, around the sample, and for focusing and irradiating it upon the X-ray detector.

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Hino, Japan

Tetsuya Ozawa