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For the Inventor, By the Inventor

Aalen, Germany

Stefan Schulte

This inventor holds 17 USPTO granted patents and 4 published patent applications and 2 EPO patents. Top assignees: Carl Zeiss Smt Gmbh, Carl-Zeiss-Smt Ag. Active years: 2006-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Stefan Schulte. Retrieved from https://idiyas.com/inventor/stefan-schulte-067suwbu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 17 

% Patents Active = 82.4

 

Average Co-Inventor Count = 2.7

ph-index = 3

Forward Citations = 33(Granted Patents)


Location History:

  • Aalen, DE (2006 - 2007)
  • Aalen-Westhausen, DE (2009)
  • Aalen-Waldhausen, DE (2006 - 2013)
  • Lauchheim, DE (2021 - 2022)
  • Stoedtlen, DE (2023)
  • Stoedlen, DE (2024)

Company Filing History:

goldMedal11 out of 1,479 
 
Carl Zeiss Smt Gmbh
 patents
silverMedal6 out of 461 
 
Carl-Zeiss-Smt Ag
 patents

Years Active: 2006-2026

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17 patents (USPTO):Explore Patents
1. 12736331 - Measurement device for interferometric measurement of a surface shape (2026-09-15),
2. 12405104 - Measurement apparatus, method for measuring by interferometry, processing method, optical element and lithography system (2025-09-02),
3. 11892283 - Measuring apparatus for interferometrically determining a surface shape (2024-02-06),
4. 11774237 - Method for calibrating a measuring apparatus (2023-10-03),
5. 11360393 - Mirror, in particular for a microlithographic projection exposure system (2022-06-14),
6. 11199396 - Compensation optical system for an interferometric measuring system (2021-12-14),
7. 8593642 - Method of measuring a shape of an optical surface based on computationally combined surface region measurements and interferometric measuring device (2013-11-26),
8. 8508749 - Method of measuring a deviation of an optical surface from a target shape using interferometric measurement results (2013-08-13),
9. 8264695 - Method of measuring a deviation of an optical surface from a target shape (2012-09-11),
10. 8089634 - Optical element and method of calibrating a measuring apparatus comprising a wave shaping structure (2012-01-03),
11. 7936521 - Method of measuring a deviation of an optical surface from a target shape (2011-05-03),
12. 7602502 - Methods of testing and manufacturing optical elements (2009-10-13),
13. 7581305 - Method of manufacturing an optical component (2009-09-01),
14. 7274467 - Phase shifting interferometric method, interferometer apparatus and method of manufacturing an optical element (2007-09-25),
15. 7212289 - Interferometric measurement device for determining the birefringence in a transparent object (2007-05-01),

Title: Innovations of Stefan Schulte

Introduction

Stefan Schulte is a prominent inventor based in Aalen-Waldhausen, Germany. He has made significant contributions to the field of measurement technology, particularly in optical systems. With a total of 16 patents to his name, Schulte has established himself as a key figure in the development of advanced measurement apparatuses.

Latest Patents

Among his latest patents, Schulte has developed a measurement apparatus designed for measuring the shape of a surface of a test object using interferometry. This innovative apparatus includes a radiation source that provides an input wave and a multiply-encoded diffractive optical element. This element is configured to produce a test wave directed at the test object, which has a wavefront in the form of a free-form surface. Additionally, the apparatus features a calibration wave with a non-rotationally symmetric shape, allowing for precise measurements. The capture device within the apparatus captures a calibration interferogram formed by superimposing a reference wave with the calibration wave after interaction with a calibration object.

Career Highlights

Stefan Schulte has worked with notable companies in the optical industry, including Carl Zeiss SMT GmbH and Carl Zeiss SMT AG. His experience in these organizations has contributed to his expertise in measurement technologies and optical systems.

Collaborations

Throughout his career, Schulte has collaborated with esteemed colleagues such as Bernd Doerband and Rolf Freimann. These collaborations have further enhanced his innovative work in the field.

Conclusion

Stefan Schulte's contributions to measurement technology and optical systems are noteworthy. His patents reflect a commitment to advancing the field through innovative solutions. His work continues to influence the industry and inspire future developments.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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