The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2009
Filed:
Apr. 12, 2004
Bernhard Geuppert, Aalen, DE;
Jens Kugler, Heubach, DE;
Thomas Ittner, Aalen, DE;
Bernd Geh, Scottsdale, AZ (US);
Rolf Freimann, Aalen, DE;
Guenther Seitz, Spiegelberg, DE;
Bernhard Fellner, Aalen, DE;
Bernd Doerband, Aalen, DE;
Stefan Schulte, Aalen-Waldhausen, DE;
Bernhard Geuppert, Aalen, DE;
Jens Kugler, Heubach, DE;
Thomas Ittner, Aalen, DE;
Bernd Geh, Scottsdale, AZ (US);
Rolf Freimann, Aalen, DE;
Guenther Seitz, Spiegelberg, DE;
Bernhard Fellner, Aalen, DE;
Bernd Doerband, Aalen, DE;
Stefan Schulte, Aalen-Waldhausen, DE;
Carl Zeiss SMT AG, Oberkochen, DE;
Abstract
A method of manufacturing an optical component comprising a substrate and a mounting frame with plural contact portions disposed at predetermined distances from each other is provided. The method comprises providing a measuring frame separate from the mounting frame for mounting the substrate, which measuring frame comprises a number of contact portions equal to a number of the contact portions of the mounting frame, wherein respective distances between the contact portions of the measuring frame are substantially equal to the corresponding distances between those of the mounting frame, measuring a shape of the optical surface of the substrate, while the substrate is mounted on the measuring frame, and mounting the substrate on the mounting frame such that the contact portions of the mounting frame are attached to the substrate at regions which are substantially the same as contact regions at which the substrate was attached to the measuring frame.