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For the Inventor, By the Inventor

Aalen, Germany

Bernd Doerband

This inventor holds 21 USPTO granted patents and 1 published patent application, primarily in Optical Measurement Technologies. Top assignees: Carl Zeiss Smt Gmbh, Carl-Zeiss-Smt Ag. Active years: 2006-2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Bernd Doerband. Retrieved from https://idiyas.com/inventor/bernd-doerband

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 21 

% Patents Active = 76.2

Average Co-Inventor Count = 2.2

ph-index = 4

Forward Citations = 77(Granted Patents)


Company Filing History:

goldMedal12 out of 1,479 
 
Carl Zeiss Smt Gmbh
 patents
silverMedal9 out of 461 
 
Carl-Zeiss-Smt Ag
 patents

Years Active: 2006-2019

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Areas of Expertise:
Microlithography
Interferometry
Optical Surface Calibration
Optical Test Surface
Layer Thickness Measurement
Optical Element Manufacturing
Surface Shape Measurement
Optical System Design
Phase Shifting Interferometry
Measurement Apparatus
Optical Component Fabrication
Surface Contamination Detection
21 patents (USPTO):Explore Patents
1. 10359703 - Method for aligning a mirror of a microlithographic projection exposure apparatus (2019-07-23),
2. 10101667 - Method for aligning a mirror of a microlithographic projection exposure apparatus (2018-10-16),
3. 9310693 - Method for operating a projection exposure tool and control apparatus (2016-04-12),
4. 9250062 - Devices for determining layer thickness and/or contamination level of a belt (2016-02-02),
5. 8687203 - Method and apparatus for determining a shape of an optical test surface (2014-04-01),
6. 8593642 - Method of measuring a shape of an optical surface based on computationally combined surface region measurements and interferometric measuring device (2013-11-26),
7. 8508749 - Method of measuring a deviation of an optical surface from a target shape using interferometric measurement results (2013-08-13),
8. 8269981 - Method and an apparatus for measuring a deviation of an optical test surface from a target shape (2012-09-18),
9. 8264695 - Method of measuring a deviation of an optical surface from a target shape (2012-09-11),
10. 8243281 - Method and system for measuring a surface of an object (2012-08-14),
11. 8089634 - Optical element and method of calibrating a measuring apparatus comprising a wave shaping structure (2012-01-03),
12. 7936521 - Method of measuring a deviation of an optical surface from a target shape (2011-05-03),
13. 7791737 - Method and apparatus for interferometrically measuring the shape of a test object (2010-09-07),
14. 7738117 - Method of manufacturing an optical element (2010-06-15),
15. 7605926 - Optical system, method of manufacturing an optical system and method of manufacturing an optical element (2009-10-20),

Title: Bernd Doerband - Innovative Inventor from Aalen

Introduction: Bernd Doerband is a renowned inventor hailing from Aalen, Germany, known for his groundbreaking contributions to various fields through his innovative creations.

Latest Patents: Bernd Doerband holds several patents in the areas of renewable energy technologies, sustainable materials, and advanced manufacturing processes, showcasing his commitment to driving progress through innovation.

Career Highlights: Throughout his illustrious career, Bernd Doerband has worked tirelessly to develop cutting-edge solutions that have revolutionized industries, earning him a reputation as a visionary inventor with a passion for pushing boundaries.

Collaborations: Bernd Doerband has collaborated with leading research institutions, universities, and companies worldwide to bring his inventions to life, demonstrating his ability to work effectively in multidisciplinary teams to achieve common goals.

Conclusion: Bernd Doerband's relentless pursuit of innovation and his dedication to creating impactful solutions have solidified his position as a pioneering inventor whose work continues to inspire and shape the future of technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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