The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 01, 2007
Filed:
Nov. 18, 2002
Stefan Schulte, Aalen, DE;
Uwe Gödecke, Abtsgmünd, DE;
Stefan Schulte, Aalen, DE;
Uwe Gödecke, Abtsgmünd, DE;
Carl Zeiss Smt AG, Oberkochen, DE;
Abstract
An interferometric measurement device for determining the birefringence in a transparent object comprises an interferometer with an input for an input light beam. At an output of the interferometer an object light beam passing through the object interferometrically superposes with a reference light beam not passing through the object. A positionally resolving measuring instrument determines at the interferometer output a distribution of phase differences between the object light beam and the reference light beam over the beam cross section of the beams. The measurement device further includes an instrument for modifying the polarization state of the input light beam.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile