This inventor holds 1 USPTO granted patent. Top assignee: Carl-Zeiss-Smt Ag. Active years: 2007.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2007
Title: Innovations in Optical Measurement: The Contributions of Uwe Gödecke
Introduction
Uwe Gödecke is an innovative inventor based in Abtsgmünd, Germany, recognized for his significant contributions to optical measurement technology. With a keen understanding of light behavior, he has developed a device that enhances our capability to analyze transparent materials.
Latest Patents
Gödecke holds a patent for an "Interferometric measurement device for determining the birefringence in a transparent object." This sophisticated device utilizes an interferometer featuring an input for an input light beam. The technology involves the superposition of an object light beam—passing through the transparent object—with a reference light beam that does not pass through the object. A positionally resolving measuring instrument quantifies the phase differences between these beams across their cross-section. Moreover, the device includes instruments designed to modify the polarization state of the input light beam, thereby enhancing measurement precision.
Career Highlights
Currently, Uwe Gödecke is associated with Carl Zeiss SMT AG, a leading company in the optical systems field. His role there enables him to push the boundaries of optical technology and contribute to the development of vital measurement devices that cater to various industry needs.
Collaborations
In his endeavors, Gödecke has collaborated with other talented professionals, including his coworker Stefan Schulte. Their teamwork exemplifies the collective effort required to drive forward innovation in measurement technologies.
Conclusion
Uwe Gödecke's innovative work and patent in interferometric measurement reflect his commitment to advancing optical science. His contributions not only enhance the capabilities of measurement devices but also pave the way for future developments in the industry.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile