Yalesville, CT, United States of America

Nancy C LaBianca


Average Co-Inventor Count = 3.8

ph-index = 8

Forward Citations = 205(Granted Patents)


Location History:

  • Carmel, CT (US) (2012)
  • Yalesville, CT (US) (1989 - 2014)

Company Filing History:


Years Active: 1989-2014

where 'Filed Patents' based on already Granted Patents

25 patents (USPTO):

Title: The Innovations of Nancy C. LaBianca: A Pioneer in Radiation Testing Technologies

Introduction

Nancy C. LaBianca, based in Yalesville, CT, has made significant contributions to the field of radiation testing in electronic circuits. With an impressive portfolio of 25 patents, LaBianca's work stands at the intersection of technology and safety, particularly in the detection of soft errors in integrated circuits.

Latest Patents

One of LaBianca's latest innovations includes a patent for a tunable radiation source. This invention addresses the energy distribution of soft error-inducing radiation that electronic circuits may encounter during operational processes. The development of a tuned radiation source mirrors the determined energy distribution, thereby enhancing the accuracy of testing electronic circuits.

Another significant patent focuses on SER testing for integrated circuits using a method known as hot underfill. This technique involves mixing epoxy with a radioactive source to create hot underfill (HUF) material, which is then used to underfill chips and seal them. By measuring the radioactivity of the HUF both at the edge of the chip and on a test coupon, this innovative approach allows for accurate testing of integrated circuits for soft errors related to transient-particle emissions.

Career Highlights

Nancy C. LaBianca has had a distinguished career, with key positions at leading companies such as IBM (International Business Machines Corporation) and MacDermid, Incorporated. Her expertise in radiation testing technologies has helped shape industry standards and practices, making her a recognized name in her field.

Collaborations

Throughout her career, LaBianca has collaborated with talented professionals, including notable coworkers Jeffrey Donald Gelorme and Stephen L. Buchwalter. These partnerships have likely contributed to the successful development and implementation of her innovative patented technologies.

Conclusion

Nancy C. LaBianca’s contributions to the realm of radiation testing for electronic circuits are noteworthy and reflect her dedication to advancing technology. With her extensive patent portfolio and successful collaborations, LaBianca continues to set benchmarks in the industry, ensuring safer and more reliable electronic devices for the future.

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