Location History:
- Hitachinaka, JP (2014 - 2015)
- Tokyo, JP (2009 - 2022)
Company Filing History:
12 out of 2,874 
5 out of 1,116 
2 out of 42,485 
Years Active: 2009-2025
Title: **The Innovative Mind of Michio Hatano: A Pioneer in Charged Particle Beam Technology**
Introduction
Michio Hatano, based in Tokyo, Japan, is an accomplished inventor with an impressive portfolio of 19 patents. His innovative work primarily focuses on charged particle beam devices and methodologies for non-invasive observation of biochemical samples. Hatano's latest advancements in technology demonstrate his commitment to enhancing observation techniques while reducing sample damage risks.
Latest Patents
Among his recent patents, Hatano has developed groundbreaking technologies that include the "Thin Film Damage Detection Function" and the "Charged Particle Beam Device." These inventions aim to minimize the risk of breakage of sample holders, allowing for easy observation of biochemical samples or liquid samples with high throughput. The sample holder consists of a sample chamber that encapsulates the sample between two insulating thin films, integrated within a vacuum partition wall. This innovative design enables effective detection of abnormalities in the sample chamber through a detection electrode, utilizing a signal detection unit that ultimately enhances the efficiency and accuracy of sample observation.
Career Highlights
Throughout his career, Hatano has held significant positions at prestigious organizations such as Hitachi High-Technologies Corporation and Hitachi High-Tech Corporation. His contributions in these companies have played a crucial role in advancing technologies associated with charged particle beams and related detection mechanisms.
Collaborations
Hatano's journey in the realm of innovation has also included collaborations with notable coworkers such as Sukehiro Ito and Takashi Ohshima. These partnerships have fostered an environment of creativity and exploration, driving forward the frontiers of technology in microscopy and particle beam applications.
Conclusion
In conclusion, Michio Hatano exemplifies the essence of innovation within the field of charged particle beam technology. His relentless pursuit of advanced observation methods not only facilitates scientific research but also paves the way for future innovations. With a robust patent portfolio and collaborative spirit, Hatano continues to inspire the next generation of inventors and researchers.
Inventor’s Patent Attorneys refers to legal professionals with specialized expertise in representing inventors throughout the patent process. These attorneys assist inventors in navigating the complexities of patent law, including filing patent applications, conducting patent searches, and protecting intellectual property rights. They play a crucial role in helping inventors secure patents for their innovative creations.