The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 01, 2025

Filed:

Oct. 10, 2019
Applicants:

Hitachi High-tech Corporation, Tokyo, JP;

National Institute of Advanced Industrial Science and Technology, Tokyo, JP;

Inventors:

Michio Hatano, Tokyo, JP;

Mitsuhiro Nakamura, Tokyo, JP;

Toshihiko Ogura, Tsukuba, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/2204 (2018.01); G01N 23/2251 (2018.01);
U.S. Cl.
CPC ...
G01N 23/2204 (2013.01); G01N 23/2251 (2013.01); G01N 2223/20 (2013.01); G01N 2223/30 (2013.01);
Abstract

A risk of breakage of a sample holder can be reduced and a biochemical sample or a liquid sample can be observed easily and with a high observation throughput. A sample holderholding a sample includes: a sample chamber including a first insulating thin filmand a second insulating thin filmthat sandwich and hold the samplein a liquid or gel form and face each other, a vacuum partition wall inside which the sample chamber holding the sample is fixed in a state in which the thin film is exposed to a surrounding atmosphere, and whose internal space is kept at a degree of vacuum at least lower than that of the sample room at the time of observation of the sample, a detection electrodedisposed to face the second insulating thin film in a state in which the sample chamber is fixed to the vacuum partition wall, and a signal detection unitconnected to the detection electrode. Before the surrounding atmosphere of the sample holder is evacuated from an atmospheric pressure to a vacuum, the charged particle beam device receives a detection signal from the signal detection unit via a connector and detects an abnormality of the sample chamber based on the detection signal.


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