The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 2025

Filed:

Oct. 10, 2019
Applicants:

Hitachi High-tech Corporation, Tokyo, JP;

National Institute of Advanced Industrial Science and Technology, Tokyo, JP;

Inventors:

Michio Hatano, Tokyo, JP;

Mitsuhiro Nakamura, Tokyo, JP;

Toshihiko Ogura, Tsukuba, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/20 (2006.01); H01J 37/28 (2006.01);
U.S. Cl.
CPC ...
H01J 37/20 (2013.01); H01J 37/28 (2013.01); H01J 2237/2005 (2013.01);
Abstract

A sample holder reliably holds a liquid or gel sample, and the yield of observation with a charged particle beam device is improved. A sample holderincludes a first memberthat has a lid memberand a first chipprovided with a first windowwhere a laminated film including a first insulating thin filmis formed, and a second memberthat has a base materialhaving a first bottom seal surfaceand a second bottom seal surface, an electrodedisposed on the base material, and a second chipprovided with a second windowwhere a second insulating thin filmis formed and held on the second bottom seal surface via a second seal materialsuch that the second window faces the electrode, in which a region inside a first seal material is maintained airtightly from a region outside the first seal material by the first member and the second member being combined and the first seal material being crushed between the first bottom seal surface and an upper seal surface of the lid member.


Find Patent Forward Citations

Hatano, Michio. (2025). Sample holder, intermembrane distance adjustment mechanism, and charged particle beam device (U.S. Patent No. 12315695). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12315695

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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