The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 2022

Filed:

Jul. 19, 2018
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Shuhei Yabu, Tokyo, JP;

Michio Hatano, Tokyo, JP;

Shin Imamura, Tokyo, JP;

Masaaki Komatsu, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/244 (2006.01); G02B 1/04 (2006.01); G02B 19/00 (2006.01); H01J 37/22 (2006.01);
U.S. Cl.
CPC ...
H01J 37/244 (2013.01); G02B 1/041 (2013.01); G02B 19/0009 (2013.01); H01J 37/226 (2013.01); H01J 2237/04735 (2013.01); H01J 2237/2445 (2013.01);
Abstract

In order to improve a yield of light generated by a collision between secondary electrons and gas molecules, the invention provides a charged particle beam device including: a charged particle beam source configured to irradiate a sample with a charged particle beam; a sample chamber configured to hold the sample and a gas molecule; a positive electrode configured to form an electric field that accelerates a secondary electron emitted from the sample; a photodetector configured to detect light generated by a collision between the accelerated secondary electron and the gas molecule; and a light condensing unit disposed between the sample and the photodetector, having a light emitting space in which the light is generated, and configured to condense the light generated in the light emitting space on a photodetector side.


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