Saratoga, CA, United States of America

Ellis Chang

USPTO Granted Patents = 26 

Average Co-Inventor Count = 4.0

ph-index = 10

Forward Citations = 485(Granted Patents)


Company Filing History:


Years Active: 2009-2022

where 'Filed Patents' based on already Granted Patents

26 patents (USPTO):

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Title: Innovator Spotlight: Ellis Chang - Pioneering Wafer Inspection Technologies

Introduction:

In the realm of technological advancements, there are individuals who stand out for their groundbreaking innovations. One such luminary in the field of wafer inspection technologies is Ellis Chang, a brilliant inventor hailing from Saratoga, CA, in the United States. With an impressive portfolio of 26 patents under his belt, Ellis Chang has revolutionized the domain of semiconductor manufacturing through his cutting-edge inventions.

Latest Patents:

Ellis Chang's latest patents showcase his ingenuity in developing methods and systems for the meticulous inspection of wafers and reticles using designer intent data. These patents introduce computer-implemented methods for identifying nuisance defects on wafers, detecting defects by analyzing inspection data, determining manufacturing process properties, and altering circuit designs based on inspection data. Additionally, Chang's innovations include a method and system for mixed-mode wafer inspection, which involves adjusting image pixel sizes and comparing different components to identify defects.

Career Highlights:

Throughout his illustrious career, Ellis Chang has made significant contributions to the industry while working at prestigious companies like KLA-Tencor Corporation and KLA-Tencor Technologies Corporation. His expertise and dedication to advancing wafer inspection technologies have earned him a reputation as a trailblazer in the semiconductor sector.

Collaborations:

In his professional journey, Ellis Chang has collaborated with esteemed colleagues such as Allen Park and Sagar A. Kekare. Together, they have synergized their talents to drive innovation and push the boundaries of wafer inspection technologies, setting new standards for excellence in the field.

Conclusion:

In conclusion, Ellis Chang's pioneering work in wafer inspection technologies has had a profound impact on the semiconductor industry. His inventive spirit, coupled with his technical acumen, has led to the development of cutting-edge solutions that enhance manufacturing processes and improve product quality. As a visionary inventor, Ellis Chang continues to inspire future generations of innovators to push the boundaries of what is possible in the realm of semiconductor technology.

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