Hsinchu County, Taiwan

Ching-Hsing Hsieh

USPTO Granted Patents = 14 

 

Average Co-Inventor Count = 3.0

ph-index = 3

Forward Citations = 41(Granted Patents)


Location History:

  • Taipei Hsien, TW (1999)
  • Pingtung Hsien, TW (2000 - 2001)
  • Jhubei, TW (2009)
  • Zhubei, TW (2020)
  • Hsinchu County, TW (2007 - 2021)

Company Filing History:


Years Active: 1999-2021

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14 patents (USPTO):

Title: Innovations of Inventor Ching-Hsing Hsieh

Introduction: Ching-Hsing Hsieh, an accomplished inventor based in Hsinchu County, Taiwan, has made significant contributions to the fields of automatic detection and virtual metrology systems. With a total of 14 patents to his name, Hsieh's innovations have paved the way for advances in technology and engineering.

Latest Patents: Among his latest patents, Hsieh developed an "Automatic Detecting Method and Automatic Detecting Apparatus Using the Same." This invention consists of an innovative apparatus that incorporates several units, such as an inputting unit, a dividing unit for image processing, and multiple analyzing units that work collaboratively to identify defect patterns in detected images. His other notable patent is a "Virtual Metrology System and Method," which includes a virtual metrology server that analyzes process data to optimize maintenance on process apparatus, thereby enhancing operational efficiency.

Career Highlights: Ching-Hsing Hsieh has held prominent positions in well-known companies, including United Microelectronics Corporation and United Semiconductor Corporation. Through his work, he has leveraged his skills and innovative thinking to develop cutting-edge technologies that serve various industries.

Collaborations: Throughout his career, Hsieh has collaborated with talented individuals, including his coworkers Min-Hsian Chen and Feng-Chi Chung. These collaborations have contributed to the successful realization of his projects and patents, emphasizing the importance of teamwork in the innovation process.

Conclusion: Ching-Hsing Hsieh's inventive spirit and commitment to innovation have led to the development of advanced technologies that impact many aspects of modern society. His patents not only demonstrate his technical expertise but also reflect a broader vision for the future of technology. As he continues to work in the field, Hsieh remains a pivotal figure in the evolution of automatic detection and virtual metrology systems.

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