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Test Research, Inc.

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USPTO Granted Patents = 31

EPO Patents = 1

Trademarks = 2

Forward Citations = 45

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36 inventors (with patents filed for the assignee):

Liang-Pin Yu (8 out of 10 patents)

Kuang-Pu Wen (6 out of 6 patents)

Yeong-Feng Wang (5 out of 7 patents)

4. Su-Wei Tsai (5 out of 5 patents)

5. Don Lin (4 out of 4 patents)

6. Hsin-Wei Huang (3 out of 5 patents)

7. Yu-Chen Shen (3 out of 3 patents)

8. Hsin-Hao Chen (3 out of 3 patents)

9. Shang-Tsang Yeh (3 out of 3 patents)

10. Chia-Ming Chen (3 out of 3 patents)

11. Ming-Hsien Liu (2 out of 2 patents)

12. Chien-Wei Chen (2 out of 4 patents)

13. Chia-Ho Yen (2 out of 2 patents)

14. Shih-Liang Chen (2 out of 2 patents)

15. Chih-Tien Tsai (2 out of 2 patents)

Core Competencies:

Electrical Testing Equipment

Optical Inspection

Three-Dimensional Measurement

Testing Apparatus

Circuit Testing

Defect Detection

Signal Transmission

Calibration Methods

Inspection Systems

DUT Testing

Image Compensation

Power Detection

31 patents: Sort by Forward Citations

1. 12663467 - Electrical testing equipment (2026-06-23),

2. 11686768 - System and method of testing single DUT through multiple cores in parallel (2023-06-27),

3. 11067623 - Test system and method of operating the same (2021-07-20),

4. 10841561 - Apparatus and method for three-dimensional inspection (2020-11-17),

5. 10600174 - Optical inspection apparatus (2020-03-24),

6. 10438340 - Automatic optical inspection system and operating method thereof (2019-10-08),

7. 10156606 - Multi-chassis test device and test signal transmission apparatus of the same (2018-12-18),

8. 10139454 - Test device and alternating current power detection method of the same (2018-11-27),

9. 9885561 - Optical inspection system (2018-02-06),

10. 9841387 - Inspection method and device (2017-12-12),

11. 9838612 - Inspecting device and method for inspecting inspection target (2017-12-05),

12. 9791387 - Inspection system and method for controlling the same (2017-10-17),

13. 9686517 - Optical system and image compensating method of optical apparatus (2017-06-20),

14. 9562947 - Testing apparatus for providing per pin level setting (2017-02-07),

15. 9485491 - Optical system (2016-11-01),

Company Overview

Test Research, Inc. is a prominent technology company based in Taipei, Taiwan, specializing in advanced testing and measurement solutions. The organization focuses on developing innovative equipment and software for various industries, including telecommunications, automotive, and consumer electronics. With a commitment to enhancing product quality and performance, Test Research, Inc. plays a crucial role in supporting manufacturers with reliable testing methodologies and cutting-edge technology to meet evolving market demands.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 27 2026

31 Patents

#113 in Taipei

#572 in Taiwan

#21,301 in the World

Test Research, Inc.

Forward Citations = 45

36 inventors:

Liang-Pin Yu (8 out of 10 patents)

Kuang-Pu Wen (6 out of 6 patents)

Yeong-Feng Wang (5 out of 7 patents)

4. Su-Wei Tsai (5 out of 5 patents)

5. Don Lin (4 out of 4 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Test Research, Inc.. Retrieved from https://idiyas.com/company/test-research

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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