For the Inventor, By the Inventor

Enter assignee name

Test Research, Inc.

USPTO Granted Patents = 31

EPO Patents = 1

Trademarks = 2

Forward Citations = 44

Loading Chart...

Loading Chart...

36 inventors (with patents filed for the assignee):

Liang-Pin Yu (8 out of 10 patents)

Kuang-Pu Wen (6 out of 6 patents)

Yeong-Feng Wang (5 out of 7 patents)

4. Su-Wei Tsai (5 out of 5 patents)

5. Don Lin (4 out of 4 patents)

6. Hsin-Wei Huang (3 out of 5 patents)

7. Yu-Chen Shen (3 out of 3 patents)

8. Hsin-Hao Chen (3 out of 3 patents)

9. Shang-Tsang Yeh (3 out of 3 patents)

10. Chia-Ming Chen (3 out of 3 patents)

11. Ming-Hsien Liu (2 out of 2 patents)

12. Chien-Wei Chen (2 out of 4 patents)

13. Chia-Ho Yen (2 out of 2 patents)

14. Shih-Liang Chen (2 out of 2 patents)

15. Chih-Tien Tsai (2 out of 2 patents)

31 patents: Sort by Forward Citations

1. 12663467 - Electrical testing equipment (2026-06-23),

2. 11686768 - System and method of testing single DUT through multiple cores in parallel (2023-06-27),

3. 11067623 - Test system and method of operating the same (2021-07-20),

4. 10841561 - Apparatus and method for three-dimensional inspection (2020-11-17),

5. 10600174 - Optical inspection apparatus (2020-03-24),

6. 10438340 - Automatic optical inspection system and operating method thereof (2019-10-08),

7. 10156606 - Multi-chassis test device and test signal transmission apparatus of the same (2018-12-18),

8. 10139454 - Test device and alternating current power detection method of the same (2018-11-27),

9. 9885561 - Optical inspection system (2018-02-06),

10. 9841387 - Inspection method and device (2017-12-12),

11. 9838612 - Inspecting device and method for inspecting inspection target (2017-12-05),

12. 9791387 - Inspection system and method for controlling the same (2017-10-17),

13. 9686517 - Optical system and image compensating method of optical apparatus (2017-06-20),

14. 9562947 - Testing apparatus for providing per pin level setting (2017-02-07),

15. 9485491 - Optical system (2016-11-01),

Test Research, Inc. is a leading provider of comprehensive testing and inspection solutions for various industries. With over 20 years of experience, we offer a range of high-quality testing equipment, software, and services to ensure the reliability and performance of products. Our cutting-edge technologies and expertise enable us to meet the evolving testing needs of our clients. Visit our website to learn more about our solutions and how we can assist your organization in achieving quality assurance goals.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Sep 15 2026

31 Patents

#113 in Taipei

#570 in Taiwan

#21,196 in the World

Test Research, Inc.

Forward Citations = 44

36 inventors:

Liang-Pin Yu (8 out of 10 patents)

Kuang-Pu Wen (6 out of 6 patents)

Yeong-Feng Wang (5 out of 7 patents)

4. Su-Wei Tsai (5 out of 5 patents)

5. Don Lin (4 out of 4 patents)

Please report any incorrect information to [email protected]

Loading…