The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2020
Filed:
Mar. 24, 2017
Applicant:
Test Research, Inc., Taipei, TW;
Inventors:
Assignee:
Test Research, Inc., Taipei, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/243 (2018.01); H04N 13/254 (2018.01); G01B 11/25 (2006.01); H04N 13/271 (2018.01); H04N 13/00 (2018.01);
U.S. Cl.
CPC ...
H04N 13/243 (2018.05); G01B 11/2545 (2013.01); H04N 13/254 (2018.05); H04N 13/271 (2018.05); H04N 2013/0081 (2013.01);
Abstract
An apparatus for three-dimensional inspection includes a carrier, an image sensing component, and a processor. The carrier is configured to hold an object. The image sensing component is configured to capture a first image, a second image and a third image of the object along a first axis, a second axis, and a third axis respectively, and the first axis, the second axis, and the third axis are not parallel with each other. The processor is configured to analyze the first image and the second image to obtain a first directional stereo information, and analyze the third image and a determined image of the object to obtain a second directional stereo information.