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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10438340 B1

PDFFull Text
Date of Patent:
Oct. 08, 2019

Filed:

Oct. 06, 2017

Automatic optical inspection system and operating method thereof

Applicant:

Test Research, Inc., Taipei, TW;

Inventors:

Kuang-Pu Wen, Taipei, TW;

Wen-Ming Wu, Taipei, TW;

Chun-Yen Huang, Taipei, TW;

Assignee:

Test Research, Inc., Taipei, TW;

Attorney:

CKC & Partners Co., LLC

Primary Examiner:

Marnie A Matt

Int. Cl.
CPC ...
G06T 7/00 (2017.01); H04N 5/247 (2006.01); G01N 21/88 (2006.01); G01N 21/956 (2006.01); G01N 21/95 (2006.01); G01N 21/84 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0008 (2013.01); G01N 21/8851 (2013.01); G01N 21/956 (2013.01); H04N 5/247 (2013.01); G01N 21/9501 (2013.01); G01N 2021/845 (2013.01); G01N 2021/8867 (2013.01); G01N 2021/9513 (2013.01); G01N 2021/95638 (2013.01); G01N 2201/0484 (2013.01); G06T 2207/30141 (2013.01); G06T 2207/30148 (2013.01);
Abstract

An automatic optical inspection system includes a first AOI machine and a second AOI machine, and the second AOI machine is electrically connected to the first AOI machine. The first AOI machine is configured to use a first resolution to inspect an object, so as to detect a possible defective region(s) of the object. The second AOI machine is configured to use a second resolution higher than the first resolution of the first AOI machine to inspect within the possible defective region(s) only, so as to detect whether there is/are any defect(s) within the possible defective region(s) of the object.

Find Patent Forward Citations

Wen, Kuang-Pu. (2019). Automatic optical inspection system and operating method thereof (U.S. Patent No. 10438340). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10438340

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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